1. Sensitivity analysis of multiport S-parameter measurements due to nonideal TRL calibration standards
- Author
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Yong-Jiu Zhao, Min Wang, Yonggang Zhou, and Y. M. Jin
- Subjects
Propagation of uncertainty ,Computer science ,020208 electrical & electronic engineering ,020206 networking & telecommunications ,02 engineering and technology ,Condensed Matter Physics ,Simple (abstract algebra) ,Statistics ,0202 electrical engineering, electronic engineering, information engineering ,Calibration ,Scattering parameters ,General Earth and Planetary Sciences ,Measurement uncertainty ,Node (circuits) ,Sensitivity (control systems) ,Electrical and Electronic Engineering ,Error detection and correction ,Algorithm - Abstract
In this paper, a detailed analysis of n-port VNA (vector network analyzer) measurement uncertainties due to non-ideal standards for MTRL (multiport Through-Reflect-Lines) calibration is presented. By using the concept of general node equations, the error correction equation is simplified by the matrix operation, thus a generalized formula for the deviations of the measured S-parameters with respect to the error terms is derived, which can be implemented in further analysis of multiport measurement uncertainties applying arbitrary calibration method based on 4n-term error model. The final expressions for the sensitivity coefficients of S-parameters with simple and clear form provide a deeper understanding of error propagation mechanisms.
- Published
- 2017
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