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This study investigated the improvement of the electro-optical properties of a liquid crystal (LC) cell fabricated through brush coating using graphene oxide (GO) doping. The physical deformation of the surface was analyzed using atomic force microscopy. The size of the groove increased as the GO dopant concentration increased, but the direction of the groove along the brush direction was maintained. X-ray photoelectron spectroscopy analysis confirmed that the number of C–C and O–Sn bonds increased as the GO concentration increased. Since the van der Waals force on the surface increases as the number of O–metal bonds increases, we were able to determine why the anchoring energy of the LC alignment layer increased. This was confirmed by residual DC voltage and anchoring energy measurements that were later performed. As the GO concentration increased, the width of the hysteresis curve decreased, indicating that the residual DC voltage decreased. Additionally, the 15% GO-doped sample exhibited a significant increase in its anchoring energy up to 1.34 × 10−3 J/m2, which is similar to that of rubbed polyimide. It also secured a high level of electro-optical properties and demonstrated potential as a next-generation thin-film display despite being produced via a simple brush-coating process. [ABSTRACT FROM AUTHOR]

Uniform and homogeneous liquid crystal (LC) alignment on a poly(ethylene‐co‐vinyl acetate) (EVA) layer subject to plasma ion‐beam (IB) treatment is confirmed. The layer molecular concentrations are controlled to 2, 4, and 6 wt%. Scanning electron microscopy exhibits a wrinkle pattern on the EVA surface that hinders LC alignment after IB treatment. However, X‐ray photoelectron spectroscopy shows chemical reconstruction on the surface; this induces strong van der Waals interactions with the LCs, which contribute to uniform LC alignment. The layer with higher molecular concentration is more heavily modified by IB treatment than that with low concentration, thereby achieving uniform LC alignment and overcoming topological disturbance. Contact angle analysis is used to verify that the surface energy increases via IB treatment; the uniform and homogeneous LC alignment is also confirmed by polarized optical microscopy and pretilt angle analysis. The EVA layer shows good optical transmittance and fine electro‐optical performances in terms of the switching and operating properties. Therefore, the plasma IB treatment is an effective method of deriving the surface characteristics of various polymeric materials for LC alignment, and the IB‐treated EVA layer has potential for application to LC systems. [ABSTRACT FROM AUTHOR]

This study uses imprint lithography to produce an anisotropic unidirectional indium gallium oxide (IGO) film for the uniform liquid crystal (LC) alignment layer. The curing temperature was controlled to 110, 180, and 250 °C during the process, and the 250 °C cured film presented a distinct one‐dimensional pattern transferred from the polydimethylsiloxane (PDMS) mold during scanning electron microscopy (SEM). X‐ray photoelectron spectroscopy (XPS) confirmed an active thermal oxidation effect at a high curing temperature, contributing to the formation of a unidirectional structure. This unidirectional IGO structure functioned as a guide for LCs and induced a uniform alignment state, verified by polarized optical microscopy (POM) and a pre‐tilt angle analysis. The IGO film also revealed improved thermal endurance to the LC alignment state and optical transmittance compared with the conventional rubbed polyimide (PI) layer. Given this performance, the one‐dimensional pattern‐imprinted IGO film can be a promising LC alignment layer for an advanced LC system. [ABSTRACT FROM AUTHOR]

We propose a sol-gel thin film formation process involving nanoimprint lithography. First, indium tin oxide was dissolved in 2-methoxyethanol at a ratio of 5:5 and the mixture were mixed with 10 wt% of a UV-curable. Subsequently, a polydimethylsiloxane sheet prepared by covering a silicon wafer with a polydimethylsiloxane mold was attached to a InSnO thin film to duplicate the nanostructure through UV irradiation exposure. The replicated nanostructured thin films formed about morphological and chemical composition changes on the surface, we progressed to x-ray photoelectron spectroscopy and atomic force microscopy analysis. Furthermore, atomic force microscopy image analysis showed superior patterned grooves for a UV exposure time of 3 min. A suitability test involving the measurement of the transmittance was performed for examining the suitability of the thin film for use in display devices.