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18. Modeling and characterization of interface state parameters and surface recombination velocity at plasma enhanced chemical vapor deposited SiO2-Si interface

Author

Yasutake, K., Chen, Z., Pang, S.K., and Rohatgi, A.

Subjects
Semiconductors -- Research, Surface chemistry -- Analysis, Gates (Electronics) -- Analysis, Physics
Abstract

The effective surface recombination velocity is determined as a function of gate bias voltage to study capture cross-sections at plasma enhanced chemical vapor deposited (PECVD) SiO2-Si interface states. Properties of PECVD SiO2-Si interface states are determined by capacitance voltage measurements of the metal oxide semiconductor and photoconductive voltage decay measurements. These measurements are integrated to evolve defect parameters at the interface.

Published
1994

22. Investigation of local charged defects within high-temperature annealed HfSiON/SiO2 gate stacks by scanning capacitance spectroscopy.

Author

Naitou, Y., Ando, A., Ogiso, H., Kamiyama, S., Nara, Y., Yasutake, K., and Watanabe, H.

Subjects
OXIDES, HAFNIUM, SILICON, SPECTRUM analysis, ANNEALING of metals, ELECTRIC properties of metals
Abstract

We studied the oxide charges and traps within nitrided Hf-silicate (HfSiON)/SiO2 gate stacks processed with high-temperature annealing with a spectroscopic technique by using high spatial resolution scanning capacitance microscopy. Spectroscopy was performed by detecting the static capacitance (dC/dZ) between a conductive probe and the sample while sweeping the sample bias. The dC/dZ image and spatially resolved dC/dZ-V spectrum revealed the existence of positive fixed charges within HfSiON and interface trap charges between the SiO2 underlayer and Si substrate. We also observed a transient electron trap process from the conductive probe to the HfSiON film as abrupt discontinuities in the dC/dZ-V spectrum and with bias-induced topography change of the HfSiON surface. These oxide charges and trap sites distribute inhomogeneously within HfSiON/SiO2 gate stacks, and the origin of these charged defects is ascribable to phase separation induced by high-temperature postdeposition annealing. [ABSTRACT FROM AUTHOR]

Published
2007
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23. Investigation of local charged defects within high-temperature annealed HfSiON/Si[O.sub.2] gate stacks by scanning capacitance spectroscopy

Author

Naitou, Y., Ando, A., Ogiso, H., Kamiyama, S., Nara, Y., Yasutake, K., and Watanabe, H.

Subjects
Annealing -- Analysis, Hafnium -- Thermal properties, Hafnium -- Spectra, Scanning microscopy -- Observations, Silicon-on-isolator -- Thermal properties, Silicon-on-isolator -- Spectra, Physics
Abstract

High spatial resolution scanning capacitance microscopy is used to study the oxide charges and traps within high-temperature annealed nitrided Hf-silicate (HfSiON)/Si[O.sub.2] gate stacks. The oxide charges and trap sites are distributed inhomogeneously within HfSiON/Si[O.sub.2] gate stacks and the origin of these charged defects is attributed to phase separation induced by high-temperature postdeposition annealing.

Published
2007

24. Plasma-enhanced chemical-vapor-deposited oxide for low surface recombination velocity and high effective lifetime in silicon.

Author

Chen, Z., Pang, S. K., Yasutake, K., and Rohatgi, A.

Subjects
INTERFACES (Physical sciences), CHEMICAL vapor deposition, RAPID thermal processing
Abstract

Reports on the preparation of SiO[sub2]/silicon interface by a direct plasma-enhanced chemical-vapor deposition (PECVD) followed by rapid thermal annealing (RTA). Material used in the study; Comparison of RTA and furnace annealing PECVD oxides; Effect of oxide charge on interface recombination velocity; Stability of effective lifetime in PECVD oxide.

Published
1993
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26. General Lectures-(II)

Author

Toriie, S., Nakajima, M., Kohli, Y., Takebayashi, M., Misaki, F., Kobayashi, A., Hashimoto, Y., Mitsuyoshi, Y., Ida, K., Kawai, K., Fujita, R., Kumura, F., Takahashi, M., Ohsawa, H., Hasegawa, Y., Kidokoro, T., Jojima, Y., Miyoshi, H., Okumura, Y., Yokouchi, A., Asano, H., Uehara, A., Oka, S., Saito, H., Yaginuma, M., Yamamoto, T., Asano, A., Nakamura, M., Okada, Y., Tomioka, T., Tamesue, N., Ikeda, S., Kunisaki, T., Emura, T., Yasumoto, M., Someya, N., Goto, A., Morokuma, K., Sakamoto, H., Kasaki, Y., Imamura, K., Amano, I., Iwanaga, K., Okugawa, N., Ninomiya, K., Yoshida, S., Okabe, N., Shimogawa, Y., Nakajima M., Ida, K., Akasaka, Y., Shimamoto, K., Misaki, F., Toriie, S., Tada, M., Sugawara, K., Chikayasu, I., Takeda, H., Kawai, K., Shibue, T., Yamaguchi, A., Osame, T., Shimada, K., Hori, M., Irisa, T., Miura, Y., Hanamure, B., Chuman, Y., Sato, H., Kizu, M., Kasugai, T., Kuno, N., Aoki, I., Nitta, Y., Machii, A., Murakami, Y., Aiso, Y., Kitahara, N., Yoshizawa, Y., Hishinuma, Y., Nao, Y., Ishiyama, K., Watanabe, M., Kimura, T., Hara, T., Sakaue, S., Shinoda, T., Ito, R., Hayashi, K., Sugie, H., Sekizawa, H., Nakamura, S., Kondo, J., Tanaka, E., Taniguchi, T., Kanayama, M., Koizumi, S., Watabiki, S., Ikeda, S., Tamura, K., Okada, Y., Arai, T., Saito, T., Tojo, S., Furuya, M., Hanaue, H., Ogoshi, K., Murohisa, B., Uchimura, M., Ishigaki, J., Waki, S., Nakafuji, H., Iida, F., Aratake, K., Nakano, T., Ono, N., Hara, I., Sassa, T., Takahashi, T., Inoue, J., Maruyama, Y., Mori, Y., Kawamura, T., Imai, F., Yorita, S., Saegusa, M., Ishihara, F., Asukata, I., Matsuda, M., Wakabayashi, K., Mitani, S., Sugahara, K., Ishikawa, K., Nakayoshi, A., Nakamoto, M., Kono, A., Oda, T., Sato, Y., Takahashi, T., Nagao, F., Nagano, M., Furusawa, T., Nakama, T., Itoh, H., Nishimura, M., Tsutsumi, K., Saito, H., Yoshida, K., Ito, H., Yoshimura, M., Yoshioka, K., Shimizu, T., Kuroda, C., Uchida, H., Ishida, O., Inoue, T., Hasegawa, S., Mitsusada, K., Kajiyama, Y., Matsuzawa, Y., Yokota, K., Hayashida, Y., Ikegudhi, S., Shida, S., Tsurumi, K., Ito, K., Kamiya, K., Takada, H., Ueno, S., Onda, M., Kojima, G., Shoji, E., Miyaji, M., Goto, K., Nitta, Y., Yazaki, Y., Ito, M., Kozuka, M., Tanabe, A., Murate, H., Takeuchi, T., Koshikawa, M., Kato, N., Maeda, K., Hayashi, K., Tsuru, T., Ooyama, I., Kukimoto, H., Nakashima, Y., Katsuki, T., Ueda, N., Kanno, T., Noda, A., Toda, Y., Hayakawa, T., Nakajima, S., Morishita, R., Furukawa, K., Ikeda, F., Fujii, M., Yamamoto, T., Wakisaka, G., Matasumoto, Y., Ono, H., Hirose, S., Kobayashi, K., Sawabu, N., Takeuchi, J., Kajikawa, K., Takada, A., Hirai, Y., Ohki, I., Sato, K., Tasaka, S., Sato, A., Aono, G., Kidokoro, T., Takezoe, K., Jojima, Y., Ohara, T., Soma, S., Ukawa, S., Yamaguchi, S., Shirahama, T., Sugiyama, K., Koyama, H., Haga, M., Arikawa, H., Toyokawa, H., Sato, R., Ueno, Y., Karasawa, Y., Onuma, H., Suzuki, H., Murakami, T., Yasui, A., Ichinose, Y., Hirase, Y., Okazaki, T., Takai, T., Watanabe, K., Kato, M., Yamada, M., Tsuji, T., Kunito, Y., Kobayashi, S., Udo, K., Iriyama, K., Sugiura, Y., Takahashi, Y., Kawamura, O., Ando, S., Hayashi, K., Tsuji, K., Yukawa, Y., Saito, N., Miyazawa, M., Imai, K., Tabayashi, T., Ito, H., Umehara, S., Watanabe, Y., Murai, S., Nukaga, A., Ishimatsu, N., Sotoyama, S., Abe, M., Hirai, K., Yoshida, K., Aoki, T., Nagao, F., Aoki, Y., Taniguchi, K., Wada, N., Tabuse, K., Yanagi, I., Tsuhada, K., Katsumi, M., Nakamura, K., Takemoto, K., Yamaura, Y., Karibe, N., Yamada, G., Ichikawa, H., Ogiwara, M., Matsushita, M., Kobayashi, I., Kusano, M., Yasuna, O., Hayashi, S., Yoshizumi, M., Kojima, Y., Matsubayashi, K., Yamamoto, T., Nishimura, R., Koga, M., Tachibana, M., Kurata, M., Suto, H., Ichinose, I., Ishizuka, K., Shimoda, M., Onai, M., Akiyama, T., Sekiguchi, T., Kobayashi, S., Matsuyoshi, M., Yonezawa, N., Kasamatsu, M., Yokota, Y., Toyoda, T., Uchimoto, I., Kanamoto, M., Fukai, Y., Sugawara, K., Katoh, M., Takebayashi, M., Mitsuyoshi, Y., Shimamoto, K., Nakamura, I., Tamura, M., Nishio, M., Mukaide, Y., Kuzumoto, Y., Ota, K., Yoshida, T., Sakamoto, A., Akiyama, T., Kaneko, S., Yanagida, M., Kishimoto, S., Miyaji, K., Shiraki, Y., Inoue, K., Tamada, T., Usui, T., Ohtsuka, K., Yamada, S., Fujishima, S., Tamiya, A., Saji, K., Ueda, A., Shiraki, Y., Inoue, K., Tamada, T., Usui, T., Ohtsuka, K., Yamada, S., Fujishima, S., Tamiya, A., Saji, K., Ueda, A., Yasutake, K., Irie, K., Ijiri, Y., Sato, H., Nishijima, H., Ogino, K., Okuno, T., Date, H., Yao, T., Koga, Y., Tomioka, T., Fuyuno, S., Okabe, H., Mitsui, H., Tamechika, Y., Masuda, N., Fujiwara, T., Sakimura, M., Okada, Y., Takamura, Y., Kono, T., Kurihara, M., Sumida, M., Izumi, T., Haraikawa, M., Hayakawa, H., Shirakabe, H., Yasui, A., Ushio, K., Okamoto, M., Noguchi, M., Kinoshita, A., Yamada, T., Ichikawa, H., Shimotori, K., Kudo, T., Mukaida, I., Ishikawa, H., Sato, K., Shirane, T., Kano, A., Suzuki, T., Tanaka, M., Iwanaga, T., Taniguchi, H., Inawashiro, M., Endo, N., Kawamura, T., Suzuki, Sh., Suzuki, H., Maki, T., Hayakawa, K., Ikezawa, H., Jao, C. C., Yamada, K., Nakamura, M., Tanaka, M., Maruyama, M., Nagasako, K., Oi, I., Kozu, T., Yamashita, K., Yokoyama, I., Endo, M., Takemoto, T., Nakayama, K., Hayakawa, R., Ishiguro, M., Nakano, H., Nakazawa, S., Tsuboi, Y., Yamase, H., Yamashita, T., Fujita, T., Ishikawa, Y., Ito, N., Mitsuno, T., Kanazawa, K., Yamashiro, M., Kubo, T., Iizuka, H., Watanabe, T., Sanada, M., Satoh, H., Shimada, H., Kusama, S., Ishikawa, K., Ikeda, K., Naramoto, J., Koga, M., Okazaki, Y., Nakamura, K., Kawamura, S., Fujimoto, S., Urayama, S., Matsuura, H., Sekitani, T., Sasayama, T., Nakagawa, K., Toyama, K., Nakagawa, S., Takada, T., Kusaka, K., Takaba, S., Satomura, A., Suzuki, T., Kawakami, Y., Watanabe, Y., Suzuki, H., Koike, T., Joh, S., Hara, T., Tamura, K., Kobayagawa, K., Hashimoto, T., Uemura, F., Fukui, O., Takahashi, M., Takasato, Y., Shirakawa, K., Hisamatsu, M., Saito, T., Ashizawa, S., Sakurane, Y., Miyamura, K., Sasaki, H., Katsumi, M., Ura, S., Emoto, M., Tatsumi, Y., Totsuka, Y., Chiba, N., Ozeki, M., Nakazawa, M., Takamura, S., Iida, F., Sawano, Y., Sugita, T., Funabiki, T., Watanabe, S., Moriya, T., Tomita, N., Nishida, K., Todo, A., Miyake, T., Suzaki, Y., Yamamoto, Y., Ariyoshi, J., Hajiro, K., Oishi, M., Yanagihara, K., Nakamura, A., Kuramata, H., Soeda, S., Kondo, N., Akashi, M., Hemmi, T., Kadono, H., Ito, T., Tsuchiya, R., Ikeda, Y., Futatsuki, K., Nomoto, S., Kino, I., Arai, M., Shimazu, H., Kobori, O., Ishikawa, K., Hiroshima, Y., Matsusaka, Y., Katase, K., Sakuma, Y., Murata, N., Komura, K., Ando, H., Ohara, K., Hayashi, A., Suzuki, M., Watanuki, T., Asano, T., Koide, N., Shiobara, M., Matsuo, N., Imai, K., Segawa, K., Nakazawa, S., Okabe, N., Kawai, K., Matsumoto, K., Shimada, H., Machida, K., Koizumi, Y., Hoshi, Y., Oi, M., Watanuki, T., Seki, H., Matsumura, M., Kimura, M., Yoshimura, M., Ishikawa, I., Kishi, S., Kondo, Y., Uchida, Y., Harada, H., Mandai, M., Kikuchi, T., Mishima, K., Yamagata, Y., Suyama, T., Kawagoe, K., Inagawa, T., Kishimoto, S., Sugiya, T., Kai, T., Miyoshi, A., Fukumoto, S., Watanabe, K., Kojo, H., Turuhara, I., Miyoshi, Y., Okamoto, K., Inata, H., Okamoto, H., Sakurai, S., Sugiyama, M., Sasaki, H., Miura, K., Kurihara, T., Sakumoto, K., Okita, E., Tanaka, H., Ishihara, K., Okawa, M., Okumura, Y., Watanabe, Y., Nishizaki, N., Murakami, T., Saito, K., Aoyagi, K., Hamaguchi, E., Kitamura, T., Matsuo, Y., Seki, A., Mori, H., Ishikawa, T., Nakajima, T., Shimomura, T., Sengoku, K., Aoyagi, K., Hamaguchi, E., Uchiya, Y., Yabana, T., Konta, M., Kamijo, K., Yachi, A., Okuse, S., Ohara, H., Sato, K., Wada, T., Kurata, M., Furuta, K., Nishii, M., Yamawaki, T., Nishii, K., Umeda, K., Yoshida, H., Ito, H., Okabayashi, T., Kato, Y., Yatsuji, Y., Suzuki, Y., Nomura, K., Matsumoto, K., Kamisaka, K., Motoki, T., Kamii, K., Kameda, H., Imamura, H., Uchiya, T., Ishizawa, M., Nishizaki, H., Murakami, T., Orimo, H., Yoshida, A., Yoshida, A., Orimo, H., Fujita, T., Oda, T., Itoh, Z., Honda, R., Takeuchi, S., Fukushima, T., Suda, T., Shinonaga, M., Ishiguro, N., Fujisawa, S., Nishiyama, K., and Ohkubo, T.

Published
1973
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35. Therapeutic effect of bezafibrate against biliary damage: a study of phospholipid secretion via the PPARalpha-MDR3 pathway

Author

Nakamuta, M., primary, Fujino, T., additional, Yada, R., additional, Yasutake, K., additional, Yoshimoto, T., additional, Harada, N., additional, Yada, M., additional, Higuchi, N., additional, Kato, M., additional, Kohjima, M., additional, Taketomi, A., additional, Maehara, Y., additional, Nishinakagawa, T., additional, Machida, K., additional, Matsunaga, K., additional, Nakashima, M., additional, Kotoh, K., additional, and Enjoji, M., additional

Published
2010
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44. Microbial communities developing within bulk sediments under fish carcasses on a tidal flat.

Author

Yasutake Kawamoto, Hiromi Kato, Yuji Nagata, and Jotaro Urabe

Subjects
Medicine, Science
Abstract

Animal carcasses are often brought into tidal flats where they are at the boundary between terrestrial and marine ecosystems. Since these carcasses act as microhabitats with large amounts of energy and nutrients, they likely develop unique bacterial assemblages in the ambient sediment, which in turn may stimulate colonization of other organisms such as protozoans. However, little is known about the microbial assemblages colonized in sediment around animal carcasses in the tidal zone. Herein we examined the bacterial and ciliophoran assemblages developed in association with fish carcasses by incubating the carcasses in the Higashiyachi tidal flat (Sendai, Japan). We collected sediment samples at 2, 9, and 42 days of incubation and analyzed the bacterial and ciliophoran assemblages by 16S and 18S rRNA gene amplicon sequencing. We observed significant differences in the composition and relative abundance of bacterial and ciliophoran operational taxonomic units (OTUs) between the sediments with and without the carcasses. Our analyses suggest that these unique assemblages were created through the direct effects of the carcass and indirect effects through interactions between bacteria and ciliophorans. These results also suggest that animal carcasses developed a temporally unique microbial food web in the sediments close to the carcasses, although it disappeared for several weeks.

Published
2021
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48. Combination therapy with cisplatin, 5'-deoxy-5-fluorouridine (5'-DFUR) and mitomycin (MMC) in patients with inoperable, advanced gastric cancer

Author

Koizumi, W, primary, Kurihara, M, additional, Hasegawa, K, additional, Chonan, A, additional, Kubo, Y, additional, Maekawa, R, additional, Iwasaki, R, additional, Sasai, T, additional, Fukuyama, Y, additional, Ishikawa, K, additional, Miyoshi, K, additional, Yasutake, K, additional, and Hayakawa, M, additional

Published
1996
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