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1. Characterization of Oxide Films on SiC by Spectroscopic Ellipsometry

Author

Takeshi Iida, Takeshi Iida, primary, Yuichi Tomioka, Yuichi Tomioka, additional, Yasuto Hijikata, Yasuto Hijikata, additional, Hiroyuki Yaguchi, Hiroyuki Yaguchi, additional, Masahito Yoshikawa, Masahito Yoshikawa, additional, Yuuki Ishida, Yuuki Ishida, additional, Hajime Okumura, Hajime Okumura, additional, and Sadafumi Yoshida, Sadafumi Yoshida, additional

Published
2000
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