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14 results on '"Yu, Boyu"'

5. Direct Imaging of Integrated Circuits in CPU with 60 nm Super-Resolution Optical Microscope

Author

Yang, Guang, primary, Yang, Chi, additional, Chen, Yage, additional, Yu, Boyu, additional, Bi, Yali, additional, Liao, Jiangshan, additional, Li, Haozheng, additional, Wang, Hong, additional, Wang, Yuxi, additional, Liu, Ziyu, additional, Gan, Zongsong, additional, Yuan, Quan, additional, Wang, Yi, additional, Xia, Jinsong, additional, and Wang, Ping, additional

Published
2021
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8. Circular RNA 103862 Promotes Proliferation and Invasion of Laryngeal Squamous Cell Carcinoma Cells Through the miR-493-5p/GOLM1 Axis

Author

Wang, Xin, primary, Wu, Tianyi, additional, Wang, Peng, additional, Yang, Like, additional, Li, Qiuying, additional, Wang, Jingting, additional, Zhao, Rui, additional, Zhang, Jiarui, additional, Liu, Ming, additional, Cao, Jing, additional, Tian, Linli, additional, Yu, Boyu, additional, and Sun, Yanan, additional

Published
2020
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12. Far-field transient absorption nanoscopy with sub-50??nm optical super-resolution

Author

Bi, Yali, Yang, Chi, Tong, Lei, Li, Haozheng, Yu, Boyu, Yan, Shuai, Yang, Guang, Deng, Meng, Wang, Yi, Bao, Wei, Ye, Lei, and Wang, Ping

Abstract

Nanoscopic imaging or characterizing is the mainstay of the development of advanced materials. Despite great progress in electronic and atomic force microscopies, label-free and far-field characterization of materials with deep sub-wavelength spatial resolution has long been highly desired. Herein, we demonstrate far-field super-resolution transient absorption (TA) imaging of two-dimensional material with a spatial resolution of sub-50 nm. By introducing a donut-shaped blue saturation laser, we effectively suppress the TA transition driven by near-infrared (NIR) pump–probe photons, and push the NIR-TA microscopy to sub-diffraction-limited resolution. Specifically, we demonstrate that our method can image the individual nano-grains in graphene with lateral resolution down to 36 nm. Further, we perform super-resolution TA imaging of nano-wrinkles in monolayer graphene, and the measured results are very consistent with the characterization by an atomic force microscope. This direct far-field optical nanoscopy holds great promise to achieve sub-20 nm spatial resolution and a few tens of femtoseconds temporal resolution upon further improvement and represents a paradigm shift in a broad range of hard and soft nanomaterial characterization.

Published
2020

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