29 results on '"Zaka, Alban"'
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2. Modeling Methodology for Thermal Stability Factor in Spin Transfer Torque Magneto-Resistive Random Access Memories
3. Semi-analytic Modeling for Hot Carriers in Electron Devices
4. Novel Hybrid SiGe-Silicon 5V pLDMOS on 28nm HKMG technology
5. Analysis of defect capture cross sections using non-radiative multiphonon-assisted trapping model
6. Semi-analytic Modeling for Hot Carriers in Electron Devices
7. On the accuracy of current TCAD hot carrier injection models in nanoscale devices
8. Implementation of Asymmetric Channel Implant in FDSOI Technology for Superior Analog Performance
9. TCAD Modeling and Optimization of 28nm HKMG ESF3 Flash Memory
10. Design Optimization of MV-NMOS for ESD Self-protection in 28nm CMOS technology
11. 22FDX® fMAX Optimization through Parasitics Reduction and GM Boost
12. RF performance improvement on 22FDX® platform and beyond
13. Investigation of advanced FDSOI CMOS devices for analog/mixed signal applications
14. Novel Back Gate Doping Ultra Low Retention Power 22nm FDSOl SRAM for IOT Application
15. Investigation des mécanismes d'injection des porteurs chauds, de tunneling et de dégradation pour les diélectriques dans les technologies avancées CMOS et mémoires non-volatiles
16. From MFM Capacitors Toward Ferroelectric Transistors: Endurance and Disturb Characteristics of ${\rm HfO}_{2}$-Based FeFET Devices
17. Performance investigation and optimization of Si:HfO2 FeFETs on a 28 nm bulk technology
18. TCAD Modeling for next generation CMOS devices.
19. An Efficient Nonlocal Hot Electron Model Accounting for Electron–Electron Scattering
20. Modeling Stressed MOS Oxides Using a Multiphonon-Assisted Quantum Approach—Part II: Transient Effects
21. Modeling Stressed MOS Oxides Using a Multiphonon-Assisted Quantum Approach—Part I: Impedance Analysis
22. Aging of 40nm MOSFET RF parameters under RF conditions from characterization to compact modeling for RF design
23. Characterization and Physical Modeling of Endurance in Embedded Non-Volatile Memory Technology
24. Characterization and modelling of gate current injection in embedded non-volatile flash memory
25. AC analysis of defect cross sections using non-radiative MPA quantum model
26. Programming efficiency and drain disturb trade-off in embedded Non Volatile Memories
27. From MFM Capacitors Toward Ferroelectric Transistors: Endurance and Disturb Characteristics of HfO2-Based FeFET Devices.
28. Investigation of Embedded SiGe Source/Drain for 28nm HKMG PFET Performance Enhancement
29. Investigation of Embedded SiGe Source/Drain for 28nm HKMG PFET Performance Enhancement
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