1. Domain Wall Motion Across Various Grain Boundaries in Ferroelectric Thin Films.
- Author
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Marincel, Daniel M., Zhang, Huairuo, Jesse, Stephen, Belianinov, Alex, Okatan, Mahmut B., Kalinin, Sergei V., Rainforth, W. Mark, Reaney, Ian M., Randall, Clive A., Trolier‐McKinstry, Susan, and Damjanovic, D.
- Subjects
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DOMAIN walls (Ferromagnetism) , *CRYSTAL grain boundaries , *FERROELECTRIC thin films , *PIEZORESPONSE force microscopy , *TILT boundaries , *TRANSMISSION electron microscopy - Abstract
Domain wall movement at and near engineered 10°, 15°, and 24° tilt and 10° and 30° twist grain boundaries was measured by band excitation piezoresponse force microscopy for Pb(Zr,Ti)O3 films with Zr/Ti ratio of 45/55 and 52/48. A minimum in nonlinear response was observed at the grain boundary for the highest angle twist and tilt grain boundaries, while a maximum in nonlinear response was observed at the 10° tilt grain boundaries. The observed nonlinear response was correlated with the domain configurations imaged in cross section by transmission electron microscopy. [ABSTRACT FROM AUTHOR]
- Published
- 2015
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