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Your search keyword '"microscopy systems"' showing total 4 results
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4 results on '"microscopy systems"'

1. Nonlinear Optical Microscopy and Plasmon Enhancement.

Author

Cao, Yi, Li, Jing, Sun, Mengtao, Liu, Haiyan, and Xia, Lixin

Subjects
*MICROSCOPY, *NONLINEAR optics, *SURFACE enhanced Raman effect, *SERS spectroscopy, *SURFACE plasmons, *HIGH resolution imaging, *OPTICAL microscopes
Abstract

Improving nonlinear optics efficiency is currently one of the hotspots in modern optical research. Moreover, with the maturity of nonlinear optical microscope systems, more and more biology, materials, medicine, and other related disciplines have higher imaging resolution and detection accuracy requirements for nonlinear optical microscope systems. Surface plasmons of metal nanoparticle structures could confine strong localized electromagnetic fields in their vicinity to generate a new electromagnetic mode, which has been widely used in surface-enhanced Raman scattering, surface-enhanced fluorescence, and photocatalysis. In this review, we summarize the mechanism of nonlinear optical effects and surface plasmons and also review some recent work on plasmon-enhanced nonlinear optical effects. In addition, we present some latest applications of nonlinear optical microscopy system research. [ABSTRACT FROM AUTHOR]

Published
2022
Full Text
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2. Nonlinear Optical Microscopy and Plasmon Enhancement

Author

Yi Cao, Jing Li, Mengtao Sun, Haiyan Liu, and Lixin Xia

Subjects
plasmon, nonlinear optics, microscopy systems, Chemistry, QD1-999
Abstract

Improving nonlinear optics efficiency is currently one of the hotspots in modern optical research. Moreover, with the maturity of nonlinear optical microscope systems, more and more biology, materials, medicine, and other related disciplines have higher imaging resolution and detection accuracy requirements for nonlinear optical microscope systems. Surface plasmons of metal nanoparticle structures could confine strong localized electromagnetic fields in their vicinity to generate a new electromagnetic mode, which has been widely used in surface-enhanced Raman scattering, surface-enhanced fluorescence, and photocatalysis. In this review, we summarize the mechanism of nonlinear optical effects and surface plasmons and also review some recent work on plasmon-enhanced nonlinear optical effects. In addition, we present some latest applications of nonlinear optical microscopy system research.

Published
2022
Full Text
View/download PDF

3. Method and Apparatus for a Differential Localized Microscopy System Based on Position Sensitive Detector

Author

Venky Dijkkomp, Kanai Ogale, and Ogale, Kanai

Subjects
Physics, Accuracy and precision, Localized differential method, Acoustics, Detector, ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION, Microscopy systems, Multilateration, [SPI.TRON] Engineering Sciences [physics]/Electronics, Signal-to-noise ratio, Sensor calibration, Position (vector), Distortion, Microscopy, Differential (infinitesimal), Position Sensitive Detector (PSD)
Abstract

A precise measurement of position using a Position Sensitive Detector (PSD) is fundamental in mitigating the geometric error factors that are caused by the pincushion-type distortion of these sensors. These errors can be addressed by implementing a differential localized method to significantly reduce signal to noise ratio (SNR) in PSD and the microscopy system. The differential method based on Time difference of Arrival (TDoA) is proposed and implemented in this research. The simulation and the actual results of the system further confirm the significant improvement in accuracy and precision of the system.

Published
2018

4. Non-linear Localized Filtering using Transimpedance Amplifier for Microscopy Systems Based on PSD

Author

Dijkkomp, Venky, Ogale, Kanai, and Ogale, Kanai

Subjects
Localized differential method, Sensor calibration, ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION, Microscopy systems, Position Sensitive Detector (PSD), [SPI.TRON] Engineering Sciences [physics]/Electronics
Abstract

A precise measurement of position using a Position Sensitive Detector (PSD) is fundamental in mitigating the geometric error factors that are caused by the pincushion-type distortion of these sensors. These errors can be addressed by implementing a differential localized method to significantly reduce signal to noise ratio (SNR) in PSD and the microscopy system. The differential method based on Time difference of Arrival (TDoA) is proposed and implemented in this research. The simulation and the actual results of the system further confirm the significant improvement in accuracy and precision of the system.

Published
2018

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