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The extraordinary chemistry of microdroplets has reshaped how we as a community think about reactivity near multiphase boundaries. Even though interesting physico-chemical properties of microdroplets have been reported, "sessile" droplets' inherent mobility, which has been implicated as a driving force for curious chemistry, has not been well established. This paper seeks to answer the question: Can adsorbed microdroplets be mobile at the nanoscale? This is a tantalizing question, as almost no measurement technique has the spatiotemporal resolution to answer it. Here, we demonstrate a highly sensitive technique to detect nanometric motions of insulating bodies adsorbed to electrified microinterfaces. We place an organic droplet atop a microelectrode and track its dissolution by driving a heterogeneous reaction in the aqueous continuous phase. As the droplet's contact radius approaches the size of the microelectrode, the current versus time curve remarkably displays abrupt changes in current. We used finite element modeling to demonstrate these abrupt steps are due to nanometric movements of the three-phase boundary, where the nonaqueous droplet meets the aqueous phase and the electrode. Furthermore, the velocity with which the liquid interface moves can be estimated to tens-to-hundreds of nanometers per second. Our results indicate that processes that are driven by contact electrification and the frictional movement of bodies on a surface may be at play even when a droplet seems quiescent. [ABSTRACT FROM AUTHOR]

Scanning probe microscopy (SPM) is a broad family of diagnostic methods. Common restraint of SPM is only surficial interaction with specimen, especially troublesome in case of complex volumetric systems, e.g. microbial or microelectronic. Scanning thermal microscopy (SThM) overcomes that constraint, since thermal information is collected from broader space. We present transformer bridge-based setup for resistive nanoprobe-based microscopy. With low-frequency (LF) (approx. 1 kHz) detection signal bridge resolution becomes independent on parasitic capacitances present in the measurement setup. We present characterisation of the setup and metrological description—with resolution of the system 0.6 mK with sensitivity as low as 5 mV K−1. Transformer bridge setup brings galvanic separation, enabling measurements in various environments, pursued for purposes of molecular biology. We present results SThM measurement results of high-thermal contrast sample of carbon fibres in an epoxy resin. Finally, we analyse influence of thermal imaging on topography imaging in terms of information channel capacity. We state that transformer bridge-based SThM system is a fully functional design along with low driving frequencies and resistive thermal nanoprobes by Kelvin Nanotechnology. [ABSTRACT FROM AUTHOR]

Copyright of Przegląd Elektrotechniczny is the property of Przeglad Elektrotechniczny and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)

Metrological methods rooted in natural constants present a robust strategy for ensuring traceability in nanometric measurements. A Chromium (Cr) grating, meticulously constructed through atom lithography and possessing a pitch of d = 212.7705 ± 0.0049 nm intrinsically traceable to the Cr transition frequency 7S 3 →7P 4 0, exhibits promising potential as a self-traceable length standard in nano-length metrology via a grating interferometer. The objective of this research is to elucidate and optimize the diffraction characteristics that augment the Cr grating's functionality as a self-traceable length standard within the length traceability chain predicated on the Cr transition frequency. To this end, we explore the geometric morphology and diffraction characteristics of the Cr grating. This investigation also dissects the influence of the grating's polarization-sensitive traits on the Littrow configuration grating interferometer and establishes the criteria for Cr grating fabrication. Empirically, we fabricate an enlarged Cr grating through scanning atom lithography, delineate its diffraction performance, and perform an initial verification of length measurement in a self-traceable grating interferometer. This investigation aligns with the global progression towards a more streamlined metrology development, offering a valuable benchmark for propelling future advancements in metrological technologies within the new traceability chain. • Designed self-traceable length standard with chromium atom lithography grating for precision nanometrology. • Verified Gaussian grooves in chromium grating and established direction for future fabrication. • Proved the importance of grating's polarization insensitivity for Littrow interferometers' performance. • Fabricated an expanded chromium grating and verified it in a self-traceable grating interferometer. [ABSTRACT FROM AUTHOR]

The characterization of ultrathin transparent films is paramount for various optoelectronic materials, coatings, and photonics. However, characterizing such thin layers is difficult and it requires specialized clean‐room equipment and trained personnel. Here, a contact‐less, all‐optical method is introduced and validated for characterizing nanometric transparent films using far‐field optics. A series of nanometric, smooth, and homogeneous layered samples are fabricated first, alternating transparent spacer and fluorescent layers in a controlled manner. Fluorescence radiation pattern originating from the thin fluorophore layers is then recorded and analyzed and quantitative image analysis is used to perform in operando measurements of the refractive index, film homogeneity and to estimate axial fluorophore distances at a sub‐wavelength scale with a precision of a few of nanometers. The results compare favorably to measurements obtained through more complicated and involved techniques. Applications in nanometrology and biological axial super‐resolution imaging are presented. It is demonstrated in live cells the precise axial localization of single organelles in cortical astrocytes, an important type of brain cell. The approach is cheap, versatile and it will have applications in various fields of photonics. [ABSTRACT FROM AUTHOR]

This article aims to alert about the relevance of nanosciences and nanotechnology accompanied by nanometrology for the nations development in the 21st century. Scielo was used as a database, with the keywords: nanotechnology, nanomedicine, Cuban health units. The article makes an approach to nanotechnology with an international and regional approach. It describes some applications of nanotechnologies, with an emphasis on nanomedicine, as well as the dilemmas and ethical considerations associated with them. It advises about these developments' harmfulness to human health, also defends the idea that nanometrology is essential for the technological developments achievement, with greater relevance in the nanomedicine field, as well as that nanotechnology should be treated as the 21st century science due to the social, cultural and economic impact that will have, and this can change the world. [ABSTRACT FROM AUTHOR]

Analytical chemistry is crucial for understanding the complex behavior observed for engineered nanomaterials (ENMs). A variety of analytical chemistry techniques and methodological approaches are used for isolation/purification and determination of the composition of pristine nanomaterials and for the detection, identification, and quantification of nanomaterials in nano-enabled consumer products and the complex matrices found in cosmetics, food, and environmental and biological samples. Adequate characterization of ENMs also requires physicochemical characterization of number of other properties, including size, shape, and structure. The requirement for assessment of a number of ENM properties frequently requires interdisciplinary approaches and multi-modal analysis methods. This technical report starts with an overview of ENMs definitions and classification, their properties, and analytical scenarios encountered with the analysis of both pristine nanomaterials and complex matrices containing different nanomaterials. An evaluation of the current status regarding nanomaterial identification and characterization for regulatory purposes and legislation, including emerging regulations and related scientific opinions, is provided. The technical report also presents a large and critical overview of the metrology of nanomaterials, including available reference materials and the development and validation of standardized methods that are currently available to address characterization and analysis challenges. The report focuses mainly on chemical analysis techniques and thus it is complementary to previous IUPAC technical reports focused on characterizing the physical parameters of ENMs and on nanotoxicology. [ABSTRACT FROM AUTHOR]

In this work, we identify two issues that can significantly affect the accuracy of AFM measurements of the diameter of single-wall carbon nanotubes (SWCNTs) and propose a protocol that reduces errors associated with these issues. Measurements of the nanotube height under different applied forces demonstrate that even moderate forces significantly compress several different types of SWCNTs, leading to errors in measured diameters that must be minimized and/or corrected. Substrate and nanotube roughness also make major contributions to the uncertainty associated with the extraction of diameters from measured images. An analysis method has been developed that reduces the uncertainties associated with this extraction to <0.1 nm. This method is then applied to measure the diameter distribution of individual highly semiconducting enriched nanotubes in networks prepared from polyfluorene/SWCNT dispersions. Good agreement is obtained between diameter distributions for the same sample measured with two different commercial AFM instruments, indicating the reproducibility of the method. The reduced uncertainty in diameter measurements based on this method facilitates: (1) determination of the thickness of the polymer layer wrapping the nanotubes and (2) measurement of nanotube compression at tube–tube junctions within the network. [ABSTRACT FROM AUTHOR]

An essential application of electron microscopy is to provide feedback to tune the fabrication of nanoparticles (NPs). Real samples tend to follow a size distribution commonly linked to the synthesis process used and in turn to their functional properties. This study presents an algorithm for measuring particle size distributions in electron microscopy images. State‐of‐the‐art methods based on Artificial Intelligence (e.g., Deep Learning) require extensive datasets of labeled images similar to those expected to be analyzed, and extensive supervised re‐training is often required for cross‐domain application. In contrast, the non‐AI algorithm described in this study is accurate and can be quickly set up for measuring new experimental images in different domains. The accuracy of the method is validated quantitatively and comparing graphical and descriptive statistics. Different size distributions are measured on images of platinum and gold nanocatalysts supported on carbon black, amorphous carbon, and titanium dioxide crystals. Also, images of platinum‐iron core‐shell NPs supported on thin amorphous carbon film are successfully analyzed. The limitation of evaluating different algorithms for NPs metrology is the lack of standards that different researchers can use as ground truth. In order to overcome this limitation, the images and the ground truth measurements presented here are shared as an open dataset. [ABSTRACT FROM AUTHOR]

A method to correct non-linear drift distortions in all three coordinate axes of atomic force microscope (AFM) images is presented. The method uses two measurements of the sample with two fast scan axes orthogonal to each other. Both AFM images are divided into segments and the shifts of the surface features of the segments of both images are determined. From these shifts subsequently the drift of both measurements is calculated. Depending on the segments used, significant non-linearities of the drift can be corrected. The two required measurements for this method do not have to be carried out in direct succession. With this method it is therefore possible to correct drift in an existing AFM image by measuring the sample again later. Although the method has been developed for AFM, it can also be used for other scanning probe microscopes. [ABSTRACT FROM AUTHOR]

This paper presents an innovative GPI-NCCSR subdivision approach for grating displacement sensor based on grating projection imaging (GPI) and normalized cross-correlation sub-pixel registration (NCCSR) algorithm, achieving high subdivision within the grating pitch and exhibiting robust immunity to fluctuations in light source intensity. The GPI method facilitates the creation of long-period longitudinal moiré fringes more readily, and capturing moiré fringe information with a line-scan CCD allows for an extremely high subdivision. The NCCSR approach to displacement detection is impervious to signal amplitude fluctuations, thus enhancing the stability of the subdivision. Moreover, the sub-pixel registration algorithm can improve resolution even further. The experiments demonstrate that the proposed subdivision method achieves a displacement resolution superior to 4nm RMS , indicating a subdivision multiple within the 20µm pitch exceeding 5000 while remaining unaffected by variations in light intensity. Besides, the sensor exhibits repeatability accuracy better than 0.05% across various measurement points, with a linearity of 0.17% within a 3mm range. [ABSTRACT FROM AUTHOR]

The article notes that nanometrology is an integral component of nanofabrication, and the global nanomaterials market is actively developing and its capacity in 2019 is estimated at $8.5 billion. The global nanomaterials market is actively developing, and its capacity is estimated at $8.5 billion in 2019, with a growth prospect of 13,1 % in the period up to 2027. At the same time new promising nanotechnologies and nanomaterials are created. And this requires the development of the system of nanometrology. It is considered that the system of nanoproduction-nanotechnology should solve the following tasks: smart measurements by numerical control (NC) with built-in minicomputer; offline or on-line programming of NC measuring tools with built-in minicomputer; automated replacement of workpieces and products; automated replacement of probes and sensors; automated evaluation of measurement results. A large range of electron microscopes has been developed and used worldwide to evaluate the geometry of nanoproducts. However, the development of nanotechnology requires equipping them with automated systems and appropriate software. An experimental automated device (interference profilometer) and software for non-contact measurement of micro- and nanotopography of a product surface, its three-dimensional representation, determination of roughness parameters and scanning parameters were created. An automated measurement and control system for atomic force microscopy (AFM) was developed, which has an improved control unit of laser beam positioning systems on the AFM probe. One of the directions of automation of linear measurements in nanometrology is the use of comparison standards, and this requires a corresponding adjustment of state standards of nanometrology. The analysis of published materials indicates certain positive results in the automation of nanoscale measurements in the nanofabrication environment. However, it is obvious that this direction of activity requires increased funding and new ideas to ensure the competitiveness of nanoproducts.

The semiconductor industry is moving toward a half-pitch of 7 nm. The required metrology equipment should be one order of magnitude more accurate than that. Any metrology tool is only as good as it is calibrated. The characterization of metrology systems requires test patterns that are one order of magnitude smaller than the measured features. The test sample was designed in such a way that the distribution of linewidths appears to be random at any location and any magnification. The power spectral density of such pseudo-random test pattern is inherently flat, down to the minimum size of lines. Metrology systems add a cut-off of the spectra at high frequencies; the shape of the cut-off characterizes the system in its entire dynamic range. This method is widely used in optics, and has allowed optical systems to be perfected down to their diffraction limit. There were attempts to use the spectral method to characterize nanometrology systems such as SEMs, but the absence of natural samples with known spatial frequencies was a common problem. Pseudo-random test patterns with linewidths down to 1.5 nm were fabricated. The system characterization includes the imaging of a pseudo-random test sample and image analysis by a developed software to automatically extract the power spectral density and the contrast transfer function of the nanoimaging system.

In recent years, bottom-up nanofabrication techniques and especially solution-based ones have gained significant popularity due to their relatively facile implementation, low-cost and design flexibility that allows the development of a plethora of three-dimensional nanostructures and nanoarchitectures. Nonetheless, despite the apparent simplicity of the methods, the resulting nanostructures are often morphologically and hierarchically complex with no apparent way of appropriately describing their features in a quantifiable and methodological way. In this work, we propose a symmetry-based approach for the quantitative characterization of the morphology of nanostructured surfaces. The key idea is to characterize the morphology of nanostructures by means of the fundamental spatial symmetry metrics and the deviations from the fully symmetrical counterparts. The focus of the proposed methodology is on the translational and scaling symmetry, which are investigated through the mathematical tools of Fourier and (multi)fractal analysis, respectively. The calculated metrics characterizing these symmetries are the period and the fractal dimension of surfaces while the deviations are quantified by the disorder parameter ωd related to the FWHM of Fourier peak and by the asymmetry of the multifractal spectrum for the translational and scaling symmetry respectively. As an initial study case and in order to demonstrate its suitability, the developed symmetry-based methodology was applied to nickel oxide (NiO) and copper oxide (CuO) nanostructures hydrothermally-grown on silicon substrates. The results show that even in the cases where the surfaces display similar symmetry metrics (period, fractal dimension) the symmetry-based approach reveals subtle, but quantifiable differences in the deviations from full symmetries which are not easily identified by other approaches.

Electron Tomography (ET) reconstructions can be analysed, via segmentation techniques, to obtain quantitative, 3D-information about individual nanoparticles in supported catalysts. This includes values of parameters out of reach for any other technique, like their volume and surface, which are required to determine the dispersion of the supported particle system or the specific surface area of the support; two figures that play a major role in the performance of this type of catalysts. However, both the experimental conditions during the acquisition of the tilt series and the limited fidelity of the reconstruction and segmentation algorithms, restrict the quality of the ET results and introduce an undefined amount of error both in the qualitative features of the reconstructions and in all the quantitative parameters measured from them. Here, a method based on the use of well-defined 3D geometrical models (phantoms), with morphological features closely resembling those observed in experimental images of an Au/CeO2 catalyst, has been devised to provide a precise estimation of the accuracy of the reconstructions. Using this approach, the influence of noise and the number of projections on the errors of reconstructions obtained using a Total Variation Minimization in 3D (TVM-3D) algorithm have been determined. Likewise, the benefits of using smart denoising techniques based on Undecimated Wavelet Transforms (UWT) have been also evaluated. The results clearly reveal a large impact of usual noise levels on both the quality of the reconstructions and nanometrological measurement errors. Quantitative clues about the key role of UWT to largely compensate them are also provided. [ABSTRACT FROM AUTHOR]

Copyright of Technisches Messen is the property of De Gruyter and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)

Semiconductor single-walled carbon nanotube (s-SWNT) networks have gained prominence in electronic devices due to their cost-effectiveness, relatively production-naturality, and satisfactory performance. Configuration, density, and resistance of SWNT-SWNT junctions are considered crucial factors influencing the overall conductivity of s-SWNT networks. In this study, we present a method for inferring the lower bounds of the SWNT-SWNT junction resistance in s-SWNT networks based on conductive atomic force microscopy TUNA images. This method further enables the proposal of a classification for SWNT-SWNT junctions based on the current behavior relative to their surroundings. The three types of SWNT-SWNT junctions are denoted as (i) true contact (T), (ii) poor contact (P), and (iii) false contact (F). Of them, the true and poor contacts, respectively, represent good and poor electrical contact for the subject SWNT-SWNT junctions whose electrical conductivity hardly improves under external tip pressure, while that of the false contact can be further improved by external pressure. Statistical analysis demonstrates that while T-type junctions make a significant contribution to network conductivity, their proportion accounts for only approximately 40%. The P-type and F-type junctions, which constitute over 60% of the total, may be a contributing factor that constrains the overall conductivity of the s-SWNT networks. The height ratio of the junction to the sum of two SWNTs was also observed to exhibit variations among the three types. Finally, we propose a three-dimensional model to elucidate the formation mechanism underlying each type of junction. The present study provides insights into the performance of spontaneous contacts between s-SWNTs in the networks, and the systematic image acquisition and junction classification processes may provide support for future advancements in these networks.

Conventional spectroscopic ellipsometry is a powerful tool in optical metrology. However, when it comes to the characterization of non-periodic nanostructures or structured fields that are much smaller than the illumination spot size, it is not well suited as it integrates the results over the whole illuminated area. Instead, imaging ellipsometry can be applied. Especially imaging Mueller matrix ellipsometry is highly useful in nanostructure characterization and defect inspection, as it is capable to measure the complete Mueller matrix for each pixel in a microscope image of the sample. It has been shown that these so-called Mueller matrix images can help to distinguish geometrical features of nanostructures in the sub-wavelength regime due to visible differences in off-diagonal matrix elements. To further investigate the sensitivity of imaging Mueller matrix ellipsometry for sub-wavelength sized features, we designed and fabricated a sample containing geometrical nanostructures with lateral dimensions ranging from 50 to 5,000 nm. The structures consist of square and circular shapes with varying sizes and corner rounding. For the characterization of their Mueller matrix images, we constructed an in-house Mueller matrix microscope capable of measuring the full Mueller matrix for each pixel of a CCD camera, using an imaging system and a dual-rotating compensator configuration for the ellipsometric system. The samples are illuminated at 455 nm wavelength and the measurements can be performed in both transmission and reflection. Using this setup, we systematically examine the sensitivity of Mueller matrix images to small features of the designed nanostructures. Within this contribution, the results are compared with traceable atomic force microscopy measurements and the suitability of this measurement technique in optical nanometrology is discussed. AFM measurements confirm that the fabricated samples closely match their design and are suitable for nanometrological test measurements. Mueller matrix images of the structures show close resemblance to numerical simulations and significant influence of sub-wavelength features to off-diagonal matrix elements.

Copyright of Journal of Measurement Science & Instrumentation is the property of Journal of Measurement Science & Instrumentation and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)

This review summarizes recent progress performed in the design and application of analytical tools and methodologies using nanomaterials for pharmaceutical analysis, and specifically new nanomedicines at distinct phases of development and translation from preclinical to clinical stages. Over the last 10–15 years, a growing number of studies have utilized various nanomaterials, including carbon-based, metallic nanoparticles, polymeric nanomaterials, materials based on biological molecules, and composite nanomaterials as tools for improving the analysis of pharmaceutical products. New and more complex nanomaterials are currently being explored to influence different stages of the analytical process. These materials provide unique properties to support the extraction of analytes in complex samples, increase the selectivity and efficiency of chromatographic separations, and improve the analytical properties of many sensor applications. Indeed, nanomaterials, including electrochemical detection approaches and biosensing, are expanding at a remarkable rate. Furthermore, the analytical performance of numerous approaches to determine drugs in different matrices can be significantly improved in terms of precision, detection limits, selectivity, and time of analysis. However, the quality control and metrological characterization of the currently synthesized nanomaterials still depend on the development of new and improved analytical methodologies, and the application of specific and improved instrumentation. Therefore, there is still much to explore about the properties of nanomaterials which need to be determined even more precisely and accurately. [Display omitted] • Cutting-edge NMs with sophisticated structures are revolutionizing drug analysis. • NMs elevate the efficiency and accuracy of facets within the analytical workflow. • NMs enhance drug extraction and separation, showcasing versatility and applicability. • NMs are crucial in drug sensors, offering unprecedented sensitivity and selectivity. • Nanometrology faces the need for CRMs and standardized methods to authenticate NMs. [ABSTRACT FROM AUTHOR]

Heavily boron doped diamond epilayers with thicknesses ranging from 40 to less than 2 nm and buried between nominally undoped thicker layers have been grown in two different reactors. Two types of [100]-oriented single crystal diamond substrates were used after being characterized by X-ray white beam topography. The chemical composition and thickness of these so-called deltadoped structures have been studied by secondary ion mass spectrometry, transmission electron microscopy, and spectroscopic ellipsometry. Temperature-dependent Hall effect and four probe resistivity measurements have been performed on mesa-patterned Hall bars. The temperature dependence of the hole sheet carrier density and mobility has been investigated over a broad temperature range (6K

Copyright of Technisches Messen is the property of De Gruyter and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)

One of the challenges faced in accurately measuring nanoscale surface roughness using Atomic Force Microscopy (AFM) techniques are the geometric interactions of the surface with the AFM probe-tip. What is the significance of these effects, and to what extent do they reduce the effectiveness of an AFM as a nanospatial measurement tool of surfaces with roughness? The aim of this work is to develop a framework by which an AFM user would be able to automatically [1] quantify the magnitude these effects from geometric tip-sample interactions have on measurement accuracy. In turn, the AFM user would then be able to make an informed decision on whether additional methods need to be applied to correct these measurements. To accomplish this, a numerical model is developed that can generate sets of ‘true’ stochastic surfaces of various statistical roughness parameters as well as various probe-tip shapes. The model then simulates, using such probe-tips, the scanning procedure of an AFM on such sets of surfaces to produce corresponding measurement images. The difference, due to geometric tip-sample interactions, between the ‘true’ surfaces and the measured images is quantified, over various ranges of roughness parameters for different probe-tips, with a novel certainty metric to create certainty graphs. These graphs show for a given tip, the significance of the tip effects due to surface roughness and thus the extent of measurement inaccuracy.

The geometrical design of probe-tips used in atomic force microscopy (AFM) can have a significant impact on the quality of scanned measurement images which are directly related to the roughness of the sample surface being investigated. When a non-suitable probe-tip is selected to scan a given sample surface, this can give rise to imaging artifacts which result from geometrical tip-sample interactions as the true image of the surface being scanned will be morphologically dilated by the tip. In this paper, the impact of these imaging artifacts on AFM measurement accuracy can be predicted by using a multi-layered neural network, by involving surface roughness and the geometry of a given AFM rigid probe-tip. The neural network is trained by using data produced from simulated AFM measurements, and shows a good level of fit for both training and test sets. Evaluation of tip-sample effects using such a machine learning approach could allow for a fast and efficient probe-tip selection process that can reduce the operational costs of an AFM measurement.

The goal of the work, described in this paper, was to examine and analyse measurement capabilities of GUM Length and Angle Department in measurements of step height/depth standards with the values below 1 μm (nanostandards), with 2D, and 3D surface characteristics. Measurements were performed with microinterforometer and stylus profilometer. Keywords: nanometrology, depth/height standards, microinterferometry, contact profilometry.

Nanometrology is an intrinsic and fast developing part of nanoscience. Given the huge diversity of nanostructures ranging from large molecules from about 10 atoms to structures from 105 atoms (particles of the size ≤ 100 nm), broader investigations in this area cannot be exactly scrutinized nor repeated by the existing capacities. This gave rise to the initiative for reproducibility that aims to avoid simplified approaches, plagiarism and other phenomena that are often triggered by the "publish or perish" philosophy, as well as business practices of predatory journals. In this paper, we discuss two case studies illustrating how to solve these problems: a study of the structural stability of nanoparticles by three complementary methods, and a design of reliable nanoparticle gas sensors used in environment or medicine.

Copyright of Innotec is the property of Laboratorio Tecnologico del Uruguay and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)

To assess the fate and behavior of engineered nanoparticles in the aquatic environment, it is crucial to conduct appropriate bacterial bioassay procedure. However, test conditions of bacterial bioassay are limitedly investigated; especially in the field of environmental media chemistry or aging of nanoparticles which interfere the procedure. For this purpose, TiO2 nanoparticles were treated with different test conditions by keeping them in 1% and 100% seawater for one day and 20 days. The bacterial bioassay of treated nanoparticles towards gram-negative (Pseudomonas aeruginosa) and gram-positive (Staphylococcus aureus) bacteria were examined, as well as the mechanism by biochemical responses of bacteria and physicochemical properties of TiO2 nanoparticles. The viability response of tested bacteria reduced remarkably in seawater concentration, while treatment (aging) duration of tested nanoparticles slightly affected the viability response of tested bacteria. Moreover, key events which affected the bioassay response were changed with the treatment duration and media concentration. The results also showed that aging duration and concentration of the media influenced the main physicochemical properties due to the alterations in surface from aging media compared to unaged ones. [ABSTRACT FROM AUTHOR]

This paper presents the results of experimental studies and digital methods for recording of holograms using spatial light modulators. The use of holographic interference methods for measuring nanoscale irregularities is described for the case of a nanostep (70 nm in height and 30 m in width). Examples are given of the method of increased sensitivity for nanostep measurements and the method of hooks using a digital technique. Correction of internal system distortions in the interferometer has been shown to be a workable method. The holographic interference methods with digital processing of holograms allows the sensitivity of interferograms to be increased without loss of basic information about the object and without increasing the measurement accuracy. [ABSTRACT FROM AUTHOR]

Organic-inorganic hybrids (OIH) are considered to be a powerful platform for applications in many research and industrial fields. This review highlights the application of OIH for chemical analysis, biosensors, and environmental monitoring. A methodology toward metrological traceability measurement and standardization of OIH and demonstration of the role of mathematical modeling in biosensor design are also presented. The importance of the development of novel types of OIH for biosensing applications is highlighted. Finally, current trends in nanometrology and nanobiosensors are presented. [ABSTRACT FROM AUTHOR]

The acquisition of large atomic-force-microscopy (AFM) scans at nanoscale resolutions can take hours and produce datasets with millions of pixels, which is time consuming and computationally expensive to analyze. In this paper, we present an approach to speedup this process by using a computer-vision algorithm, namely the Noise2Noise algorithm, to reconstruct high-resolution, low scan speed AFM data from high-speed, noisy, sparsely sampled AFM data. This algorithm is trained on various noise types to reproduce different sources of experimental noises encountered during the acquisition of AFM data. Our results demonstrate that a sparse, uniform AFM scan of 20 × 20 μ m at 128 × 128 pixel resolution can be processed within seconds, and the output image is comparable to a higher quality raw AFM data scan which required 30 minutes or more to collect and process manually, reducing not only the acquisition and analysis time, but also the size of the data being collected. • High resolution, low scan speed AFM images are reconstructed from higher scan speeds data. • The Noise2Noise algorithm is used to map noisy AFM images to clean AFM images. • Several noise modes are used to train the algorithm to mimic realistic noises in AFM data. • Process of raw and fast scan data corrections leads to up to 70% improvement in image quality. [ABSTRACT FROM AUTHOR]

Synthetic data are of increasing importance in nanometrology. They can be used for development of data processing methods, analysis of uncertainties and estimation of various measurement artefacts. In this paper we review methods used for their generation and the applications of synthetic data in scanning probe microscopy, focusing on their principles, performance, and applicability. We illustrate the benefits of using synthetic data on different tasks related to development of better scanning approaches and related to estimation of reliability of data processing methods. We demonstrate how the synthetic data can be used to analyse systematic errors that are common to scanning probe microscopy methods, either related to the measurement principle or to the typical data processing paths.

This paper deals with determination of uncertainty and individual contributions to the measurement uncertainty on the CMM SIOS NNM-1 instrument fitted with the touch-probe scanning system Gannen XP. Manufacturer SIOS designates this machine as nano-CMM. Two non-simulation methods to determine the measurement uncertainty, the substitution and multi-position methods are addressed in detail [Sramek, Jankovych 2018]. Ruby balls with various nominal diameters are used as the measured objects. One simulation method to determine the measurement uncertainty, the Monte Carlo method, is also addressed in this paper. The paper also summarizes and specifies calculation methods to determine the measurement uncertainty, and provides results of representative sets of measurements, including determination of the expanded measurement uncertainty. This paper contains novel conclusions in the area of uncertainty measurement of nano-CMMs. [ABSTRACT FROM AUTHOR]

We introduce the optical ruler, an electromagnetic analog of a physical ruler, for nanoscale displacement metrology. The optical ruler is a complex electromagnetic field in which singularities serve as the marks on the scale. It is created by the diffraction of light on a metasurface, with singularity marks then revealed by high-magnification interferometric observation. Using a Pancharatnam-Berry phase metasurface, we demonstrate a displacement resolving power of better than 1 nanometer (l/800, where l is the wavelength of light) at a wavelength of 800 nanometers. We argue that a resolving power of ~l/4000, the typical size of an atom, may be achievable. An optical ruler with dimensions of only a few tens of micrometers offers applications in nanometrology, nanomonitoring, and nanofabrication, particularly in the demanding and confined environment of future smart manufacturing tools. [ABSTRACT FROM AUTHOR]

In nanodosimetry, the ionization component of charged particle track structure is characterized by measuring the frequency distribution of ionizations in target volumes that simulate nanometric sites in liquid water. For the Ion Counter nanodosimeter at PTB, the sensitive volume is defined by the electrical field and the extraction aperture. In this paper, a procedure is presented to define a cylindrical effective measurement target based on the second moments of the detection efficiency map. An analytical model of the efficiency map is developed to investigate the dependence of the simulated site size on the nanodosimeter's operating parameters. Within the limits of the simplifying assumptions, the model gives a reasonable approximation of the efficiency map. [ABSTRACT FROM AUTHOR]

Graphical abstract Highlights • Experimental confirmation of operability of the method of distributed calibration. • Measurement of the standard surface with the method of feature-oriented scanning (FOS). • Insusceptibility of calibration results to thermal drift of the head and to creep of piezomanupulators. • Reduction of noises and instabilities by means of repeated measurements unlimited by number. • Accurate calibration of a probe microscope scanner by graphite crystal lattice at room temperature. Abstract A method is described intended for distributed calibration of a probe microscope scanner consisting in a search for a net of local calibration coefficients (LCCs) in the process of automatic measurement of a standard surface, whereby each point of the movement space of the scanner can be defined by a unique set of scale factors. Feature-oriented scanning (FOS) methodology is used to implement the distributed calibration, which permits to exclude in situ the negative influence of thermal drift, creep and hysteresis on the obtained results. The sensitivity of LCCs to errors in determination of position coordinates of surface features forming the local calibration structure (LCS) is eliminated by performing multiple repeated measurements followed by building regression surfaces. There are no principle restrictions on the number of repeated LCS measurements. Possessing the calibration database enables correcting in one procedure all the spatial distortions caused by nonlinearity, nonorthogonality and spurious crosstalk couplings of the microscope scanner piezomanipulators. To provide high precision of spatial measurements in nanometer range, the calibration is carried out using natural standards – constants of crystal lattice. The method allows for automatic characterization of crystal surfaces at room temperature. The method may be used with any kind of scanning probe microscope (SPM). [ABSTRACT FROM AUTHOR]

Abstract Analytical nanometrology is a present challenge in today's analytical science, particularly from a practical point of view and when it is addressed to routine/control laboratories. In this way, a screening-confirmation approach is described for the characterization and distinction between titanium dioxide nano/micro-particles in sugary food samples. The first step involves the confirmation of the presence of TiO 2 in the sample (used as additive E171 in sugary samples), using a portable Raman spectrometer, in which the crystalline structure of TiO 2 (anatase or rutile) in the positive samples can be also obtained in this step. Then, the second step was only applied to positive samples, and it involves the use of Capillary Electrophoresis (CE), which allows to distinguish between TiO 2 -nanoparticles (<100 nm) from TiO 2 -microparticles (>100 nm). Additionally, nanoparticles (TiO 2 anatase (5 nm diameter) and TiO 2 rutile (60 nm diameter) and rutile microparticles (0.1–0.2 μm diameter) can be electrophoretically separated. The general procedure is simple, fast, and low cost, providing a valuable analytical tool in the field of food safety and control, thus contributing to the development of the analytical nanometrology. Graphical abstract Image 1 Highlights • Discrimination between titanium dioxide nano/micro particles. • Application to sugary samples. • Screening-confirmation method based on Raman – Capillary Electrophoresis. • Contribution to the development of analytical nanometrology. • Approach capable to be expand to other matrices. [ABSTRACT FROM AUTHOR]