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Accurately predicting a quantum computer's capability—which circuits it can run and how well it can run them—is a foundational goal of quantum characterization and benchmarking. As modern quantum computers become increasingly hard to simulate, we must develop accurate and scalable predictive capability models to help researchers and stakeholders decide which quantum computers to build and use. In this work, we propose a hardware-agnostic method to efficiently construct scalable predictive models of a quantum computer's capability for almost any class of circuits and demonstrate our method using convolutional neural networks (CNNs). Our CNN-based approach works by efficiently representing a circuit as a 3-D tensor and then using a CNN to predict its success rate. Our CNN capability models obtain approximately a 1% average absolute prediction error when modeling processors experiencing both Markovian and non-Markovian stochastic Pauli errors. We also apply our CNNs to model the capabilities of cloud-access quantum computing systems, obtaining moderate prediction accuracy (average absolute error around 2–5%), and we highlight the challenges to building better neural network capability models.

We present a simple and powerful technique for finding a good error model for a quantum processor. The technique iteratively tests a nested sequence of models against data obtained from the processor, and keeps track of the best-fit model and its wildcard error (a metric of the amount of unmodeled error) at each step. Each best-fit model, along with a quantification of its unmodeled error, constitutes a characterization of the processor. We explain how quantum processor models can be compared with experimental data and to each other. We demonstrate the technique by using it to characterize a simulated noisy two-qubit processor.

Randomized benchmarking (RB) protocols have become an essential tool for providing a meaningful partial characterization of experimental quantum operations. While the RB decay rate is known to enable estimates of the average fidelity of those operations under gate-independent Markovian noise, under gate-dependent noise this rate is more difficult to interpret rigorously. In this paper, we prove that single-qubit RB decay parameter p coincides with the decay parameter of the gate-set circuit fidelity, a novel figure of merit which characterizes the expected average fidelity over arbitrary circuits of operations from the gate-set.Wealso prove that, in the limit of high-fidelity single-qubit experiments, the possible alarming disconnect between the average gate fidelity and RB experimental results is simply explained by a basis mismatch between the gates and the state-preparation and measurement procedures, that is, to a unitary degree of freedom in labeling the Pauli matrices. Based on numerical evidence and physically motivated arguments, we conjecture that these results also hold for higher dimensions. [ABSTRACT FROM AUTHOR]

We discuss the effects of a gauge freedom in representing quantum information processing devices, and its implications for characterizing these devices. We demonstrate with experimentally relevant examples that there exists equally valid descriptions of the same experiment which distribute errors differently among objects in a gate-set, leading to different error rates. Consequently, it can be misleading to attach a concrete operational meaning to figures of merit for individual gate-set elements. We propose an alternative operational figure of merit for a gate-set, the mean variation error, and a protocol for measuring this figure.

There is currently a significant need for robust and efficient methods for characterizing quantum devices. While there has been significant progress in this direction, there remains a crucial need to precisely determine the strength and type of errors on individual gate operations, in order to assess and improve control as well as reliably bound the total error in a quantum circuit given some partial information about the errors on the components. In this work, we first provide an optimal bound on the total fidelity of a circuit in terms of component fidelities, which can be efficiently experimentally estimated via randomized benchmarking (RB). We then derive a tighter bound that applies under additional information about the coherence of the error, namely, the unitarity, which can also be estimated via a related experimental protocol. This improved bound smoothly interpolates between the worst-case quadratic and best-case linear scaling for composite error channels. As an application we show how our analysis substantially improves the achievable precision on estimates of the infidelities of individual gates under interleaved RB, enabling greater precision for current experimental methods to assess and tune-up control over quantum gate operations.

Randomized benchmarking (RB) protocols have become an essential tool for providing a meaningful partial characterization of experimental quantum operations. While the RB decay rate is known to enable estimates of the average fidelity of those operations under gate-independent Markovian noise, under gate-dependent noise this rate is more difficult to interpret rigorously. In this paper, we prove that single-qubit RB decay parameter p coincides with the decay parameter of the gate-set circuit fidelity , a novel figure of merit which characterizes the expected average fidelity over arbitrary circuits of operations from the gate-set. We also prove that, in the limit of high-fidelity single-qubit experiments, the possible alarming disconnect between the average gate fidelity and RB experimental results is simply explained by a basis mismatch between the gates and the state-preparation and measurement procedures, that is, to a unitary degree of freedom in labeling the Pauli matrices. Based on numerical evidence and physically motivated arguments, we conjecture that these results also hold for higher dimensions.