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Atomic probe tomography (APT) samples with Al/Ni multilayer structure were successfully prepared by using a focused ion beam (FIB), combining with a field emission scanning electron microscope, with a new single-wedge lift-out method and a reduced amorphous damage layer of Ga ions implantation. The optimum vertex angle and preparation parameters of APT sample were discussed. The double interdiffusion relationship of the multilayer films was successfully observed by the local electrode APT, which laid a foundation for further study of the interface composition and crystal structure of the two-phase composites.

In order to speed up the simulation of single-wedge cross wedge rolling with the help of Pro/ENGINEER 2001 software, the source program to set up the CWR model is devised in the CWR modeling. As an example, the modeling technology of one part is studied in particular. By finite element simulation and rolling experiments, this method has proven to yield higher calculating efficiency and more correct calculated results than before. It can provide good precondition for CWR dies designing by parameters and finite element simulation. [ABSTRACT FROM AUTHOR]

Atomic probe tomography (APT) samples with Al/Ni multilayer structure were successfully prepared by using a focused ion beam (FIB), combining with a field emission scanning electron microscope, with a new single-wedge lift-out method and a reduced amorphous damage layer of Ga ions implantation. The optimum vertex angle and preparation parameters of APT sample were discussed. The double interdiffusion relationship of the multilayer films was successfully observed by the local electrode APT, which laid a foundation for further study of the interface composition and crystal structure of the two-phase composites. [ABSTRACT FROM AUTHOR]