1. THz dielectric properties of AlPO4-BPO4-SiO2 ternaries.
- Author
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Bian, J.J., Wang, H., and Wang, H.J.
- Subjects
- *
DIELECTRIC properties , *PERMITTIVITY , *DIELECTRIC loss , *DIELECTRICS , *PHONONS - Abstract
0.05AlPO 4 -0.05BPO 4 -0.90SiO 2 glass-ceramic and glass-free 0.45AlPO 4 -0.45BPO 4 -0.10SiO 2 ceramic have been prepared by a solid-state reaction process and their terahertz (THz) dielectric responses were characterized by time-domain spectroscopy (TDS) techniques in the frequency range from 0.2 to 1.6 THz. Both samples demonstrate little dielectric dispersions in the (sub) THz frequency range, having dielectric permittivities (ε r) of ∼3.35(7) and ∼4.06(8), respectively. The dielectric responses are dominated by the phonons and electronic polarizations in the (sub) THz frequency range. The contributions to the relative permittivities from electronic polarization ε r ∞ are 1.85(4) and 1.99(4), which are ∼55% and ∼49% of the total ε r at THz frequencies, respectively. The dielectric losses of both samples continuously increase with increasing frequency in the THz band, while the loss factor of glass-ceramic is one order of magnitude higher than that of glass-free ceramic. The glass-free sample exhibits extremely high Q×f values of 100,000–190,000 GHz in the THz band, being much higher than that of the glass-ceramic (∼7000–25,000 GHz). [ABSTRACT FROM AUTHOR]
- Published
- 2023
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