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17 results on '"van de Mortel-Fronczak, J. M."'

1. Development of a 3D Digital Twin of the Swalmen Tunnel in the Rijkswaterstaat Project

Author

van Hegelsom, J., van de Mortel-Fronczak, J. M., Moormann, L., van Beek, D. A., and Rooda, J. E.

Subjects
Computer Science - Human-Computer Interaction, Electrical Engineering and Systems Science - Systems and Control
Abstract

In an ongoing project, a cooperation between the TU/e and the Dutch Department of Waterways and Public Works (Rijkswaterstaat in Dutch, abbreviated to RWS) is established. The project focuses on investigating applicability of synthesis-based engineering in the design of supervisory controllers for bridges, waterways and tunnels. Supervisory controllers ensure correct cooperation between components in a system. The design process of these controllers partly relies on simulation with models of the plant (the physical system). A possible addition to this design process is digital twin technology. A digital twin is a virtual copy of a system that is generally much more realistic than the 2D simulation models that are currently used for supervisory controller validation. In this report, the development of a digital twin of the Swalmen tunnel that is suitable for supervisory control validation is described. The Swalmen tunnel is a highway tunnel in Limburg, the Netherlands. This case study is relevant, because the Swalmen tunnel will be renovated in 2023 and 2028. These renovation projects include updating controlled subsystems in the tunnel, such as boom barriers and traffic lights, and updating the supervisory controller of the tunnel. The digital twin might be useful to aid the supervisory controller design process in these renovation projects.

Published
2021

2. Synthesis and Implementation of Distributed Supervisory Controllers with Communication Delays

Author

Schouten, R. H. J., Moormann, L., van de Mortel-Fronczak, J. M., and Rooda, J. E.

Subjects
Computer Science - Formal Languages and Automata Theory
Abstract

In literature, extensive research has been done with respect to synthesis of supervisory controllers. Such synthesized supervisors can be distributed for implementation on multiple physical controllers. This paper discusses a method for distributing a synthesized supervisory controller. In this method, dependency structure matrices are used to distribute a system, the supervisor is then distributed accordingly, using existing localization theory. The existence of communication delays between supervisory controllers is unavoidable in a distributed application. The influence of these delays on the behavior of a supervisor is therefore studied using delay robustness theory. This paper introduces the use of mutex algorithms to make the distributed supervisor delay-robust. A case study is used to demonstrate the method and hardware in the loop testing is used to validate the resulting distributed supervisor., Comment: 14 pages, 22 figures

Published
2021

3. Eclipse ESCET™: The Eclipse Supervisory Control Engineering Toolkit

Author

Fokkink, W. J., Goorden, M. A., Hendriks, D., van Beek, D. A., Hofkamp, A. T., Reijnen, F. F. H., Etman, L. F. P., Moormann, L., van de Mortel-Fronczak, J. M., Reniers, M. A., Rooda, J. E., van der Sanden, L. J., Schiffelers, R. R. H., Thuijsman, S. B., Verbakel, J. J., Vogel, J. A., Goos, Gerhard, Founding Editor, Hartmanis, Juris, Founding Editor, Bertino, Elisa, Editorial Board Member, Gao, Wen, Editorial Board Member, Steffen, Bernhard, Editorial Board Member, Yung, Moti, Editorial Board Member, Sankaranarayanan, Sriram, editor, and Sharygina, Natasha, editor

Published
2023
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4. Eclipse ESCET™: The Eclipse Supervisory Control Engineering Toolkit

Author

Fokkink, W. J., primary, Goorden, M. A., additional, Hendriks, D., additional, van Beek, D. A., additional, Hofkamp, A. T., additional, Reijnen, F. F. H., additional, Etman, L. F. P., additional, Moormann, L., additional, van de Mortel-Fronczak, J. M., additional, Reniers, M. A., additional, Rooda, J. E., additional, van der Sanden, L. J., additional, Schiffelers, R. R. H., additional, Thuijsman, S. B., additional, Verbakel, J. J., additional, and Vogel, J. A., additional

Published
2023
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5. The Road Ahead for Supervisor Synthesis

Author

Goorden, M. A., Moormann, L., Reijnen, F. F. H., Verbakel, J. J., van Beek, D. A., Hofkamp, A. T., van de Mortel-Fronczak, J. M., Reniers, M. A., Fokkink, W. J., Rooda, J. E., Etman, L. F. P., Goos, Gerhard, Founding Editor, Hartmanis, Juris, Founding Editor, Bertino, Elisa, Editorial Board Member, Gao, Wen, Editorial Board Member, Steffen, Bernhard, Editorial Board Member, Woeginger, Gerhard, Editorial Board Member, Yung, Moti, Editorial Board Member, Pang, Jun, editor, and Zhang, Lijun, editor

Published
2020
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6. The Road Ahead for Supervisor Synthesis

Author

Goorden, M. A., primary, Moormann, L., additional, Reijnen, F. F. H., additional, Verbakel, J. J., additional, van Beek, D. A., additional, Hofkamp, A. T., additional, van de Mortel-Fronczak, J. M., additional, Reniers, M. A., additional, Fokkink, W. J., additional, Rooda, J. E., additional, and Etman, L. F. P., additional

Published
2020
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7. CIF 3: Model-Based Engineering of Supervisory Controllers

Author

van Beek, D. A., Fokkink, W. J., Hendriks, D., Hofkamp, A., Markovski, J., van de Mortel-Fronczak, J. M., Reniers, M. A., Hutchison, David, editor, Kanade, Takeo, editor, Kittler, Josef, editor, Kleinberg, Jon M., editor, Mattern, Friedemann, editor, Mitchell, John C., editor, Naor, Moni, editor, Nierstrasz, Oscar, editor, Pandu Rangan, C., editor, Steffen, Bernhard, editor, Sudan, Madhu, editor, Terzopoulos, Demetri, editor, Tygar, Doug, editor, Vardi, Moshe Y., editor, Weikum, Gerhard, editor, Ábrahám, Erika, editor, and Havelund, Klaus, editor

Published
2014
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8. Modeling for Safety in a Synthesis-Centric Systems Engineering Framework

Author

Markovski, Jasen, van de Mortel-Fronczak, J. M., Hutchison, David, editor, Kanade, Takeo, editor, Kittler, Josef, editor, Kleinberg, Jon M., editor, Mattern, Friedemann, editor, Mitchell, John C., editor, Naor, Moni, editor, Nierstrasz, Oscar, editor, Pandu Rangan, C., editor, Steffen, Bernhard, editor, Sudan, Madhu, editor, Terzopoulos, Demetri, editor, Tygar, Doug, editor, Vardi, Moshe Y., editor, Weikum, Gerhard, editor, Ortmeier, Frank, editor, and Daniel, Peter, editor

Published
2012
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10. Exploiting Symmetry in Dependency Graphs for Model Reduction in Supervisor Synthesis

Author

Moormann, L., Van De Mortel-Fronczak, J. M., Fokkink, W. J., Rooda, J. E., Moormann, L., Van De Mortel-Fronczak, J. M., Fokkink, W. J., and Rooda, J. E.

Abstract

Supervisor synthesis enables the design of supervisory controllers for large cyber-physical systems, with high guarantees for functionality and safety. The complexity of the synthesis problem, however, increases exponentially with the number of system components in the cyber-physical system and the number of models of this system, often resulting in lengthy or even unsolvable synthesis procedures. In this paper, a new method is proposed for reducing the model of the system before synthesis to decrease the required computational time and effort. The method consists of three steps for model reduction, that are mainly based on symmetry in dependency graphs of the system. Dependency graphs visualize the components in the system and the relations between these components. The proposed method is applied in a case study on the design of a supervisory controller for a road tunnel. In this case study, the model reduction steps are described, and results are shown on the effectiveness of model reduction in terms of model size and synthesis time.

Published
2020
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11. Integration and test strategies for semiconductor manufacturing equipment

Author

De Jong, I. S M, Boumen, R., van de Mortel-Fronczak, J. M., and Rooda, J. E.

Abstract

The complexity of semiconductor manufacturing equipment is growing. This growth results in a complexity increase of the integration and test phase of these systems. Simply adding more test resources is not possible anymore, because of the cost involved. A better design of an integration and test strategy can help to optimize this hectic phase. However, methods to design and evaluate integration and test strategies for multi-disciplinary systems are hardly available. In this paper, we present a method to design and compare integration and test strategies. Following this method, an optimal integration and test strategy can be chosen from a set of possible strategies. A case has been performed where a system is integrated and tested using three different integration and test strategies: a time-to-market-driven strategy, a qualitydriven strategy and a combined quality and time-to-market strategy.

Published
2006

14. Hierarchical Test Sequencing for Complex Systems.

Author

Boumen, R., Rua, S., de Jong, I. S. M., van de Mortel-Fronczak, J. M., Rooda, J. E., and Pattipati, K. R.

Subjects
FLEXIBLE manufacturing systems, TANGRAMS, SEMICONDUCTOR manufacturing, MACHINE theory, SEARCH algorithms, PROBABILITY theory
Abstract

Testing complex systems, such as the ASML TWINSCAN lithographic machine, is expensive and time consuming. In a previous work, a test sequencing method to calculate time-optimal test sequences has been developed. Because complex systems are composed of several subsystems, which are again composed of several modules, there exists a need to hierarchically model test sequencing problems. Such a hierarchical test sequencing problem consists of a high-level model that describes a test sequencing problem at the system level, and one or more low-level models that describe the test sequencing problems at the subsystem or module level. The tests at the system level correspond to the solutions of low-level problems. This paper describes a hierarchical test sequencing model and proposes two algorithms to compute an optimal test sequence. The benefits of hierarchically modeling a problem are less computational effort and less modeling effort, because not all relations are needed. This is illustrated by a small example. The industrial relevance of this method is illustrated on a case study related to a manufacturing testing phase of a lithographic machine. [ABSTRACT FROM AUTHOR]

Published
2009
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15. Risk-Based Stopping Criteria for Test Sequencing.

Author

Boumen, R., de Jong, I. S. M., Vermunt, J. W. H., van de Mortel-Fronczak, J. M., and Rooda, J. E.

Subjects
PRODUCTION engineering, MANUFACTURING cells, SEMICONDUCTOR industry, MANUFACTURED products, MACHINERY, LITHOGRAPHY
Abstract

Testing complex manufacturing systems, like ASML lithographic machines, can take up to 45% of the total development time. The decision of when to stop testing is often difficult to make because less testing may leave critical faults in the system, while more testing increases time-to-market. In this paper, we solve the problem of deciding when to stop testing by introducing a test-sequencing method that incorporates several stopping criteria. These stopping criteria consist of objectives and constraints on the test cost and the remaining risk cost. For a given problem, a suitable stopping criterion can be chosen. For example, with the risk-based stopping criterion, testing stops when the test time or cost exceeds the risk cost. Furthermore, we show that it also is possible to model reliability problems with this test-sequencing method. The method is demonstrated on ASML systems ,with two case studies. The first case study was conducted in the test phase during the development of the software that is used to control an ASML lithographic machine. The second case study was conducted on the reliability testing of a lithographic machine. [ABSTRACT FROM AUTHOR]

Published
2008
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16. Test Sequencing in Complex Manufacturing Systems.

Author

Boumen, R., de Jong, I. S. M., Vermunt, J. W. H., van de Mortel-Fronczak, J. M., and Rooda, J. E.

Subjects
MANUFACTURING processes, COMPUTER integrated manufacturing systems, MANUFACTURING execution systems, COMPUTER systems, EXPERT systems, ALGORITHMS, SYSTEMS engineering, PRODUCTION engineering, INDUSTRIAL engineering, COMPLEXITY (Philosophy)
Abstract

Testing complex manufacturing systems, such as an ASML lithographic machine, takes up to 45% of the total development time of a system. The problem of which tests must be executed in what sequence to ensure in the shortest possible test time that the system works, which is the test-sequencing problem, was already solved by Pattipati et al. for the diagnosis of systems during operation. Test-sequencing problems during the development and manufacturing phases of systems, however, require a different approach than the test-sequencing problems during operation. In this paper, the test problem description and algorithms developed by Pattipati et a!. are extended to solve test-sequencing problems for the development and manufacturing of manufacturing systems. For a case study in the manufacturing process of an ASML lithographic machine, it is shown that solving a test-sequencing problem with this method can reduce the test time by 15% to 30% compared to experts that solve this problem manually. [ABSTRACT FROM AUTHOR]

Published
2008
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