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Simulation Study of a 3-D Device Integrating FinFET and UTBFET.

Authors :
Fahad, Hossain M.
Hu, Chenming
Hussain, Muhammad M.
Source :
IEEE Transactions on Electron Devices. Jan2015, Vol. 62 Issue 1, p83-87. 5p.
Publication Year :
2015

Abstract

By integrating 3-D nonplanar fins and 2-D ultrathin bodies, wavy FinFETs merge two formerly competing technologies on a silicon-on-insulator platform to deliver enhanced transistor performance compared with conventional trigate FinFETs with unprecedented levels of chip-area efficiency. This makes it suitable for ultralarge-scale integration high-performance logic at and beyond the 10-nm technology node. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
00189383
Volume :
62
Issue :
1
Database :
Academic Search Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
100150994
Full Text :
https://doi.org/10.1109/TED.2014.2372695