Cite
Topographic measurement of buried thin-film interfaces using a grazing resonant soft x-ray scattering technique.
MLA
Gann, Eliot, et al. “Topographic Measurement of Buried Thin-Film Interfaces Using a Grazing Resonant Soft x-Ray Scattering Technique.” Physical Review B: Condensed Matter & Materials Physics, vol. 90, no. 24, Dec. 2014, pp. 245421-1-245421–29. EBSCOhost, https://doi.org/10.1103/PhysRevB.90.245421.
APA
Gann, E., Watson, A., Tumbleston, J. R., Cochran, J., Hongping Yan, Cheng Wang, Jaewook Seok, Chabinyc, M., & Ade, H. (2014). Topographic measurement of buried thin-film interfaces using a grazing resonant soft x-ray scattering technique. Physical Review B: Condensed Matter & Materials Physics, 90(24), 245421-1-245421–245429. https://doi.org/10.1103/PhysRevB.90.245421
Chicago
Gann, Eliot, Anne Watson, John R. Tumbleston, Justin Cochran, Hongping Yan, Cheng Wang, Jaewook Seok, Michael Chabinyc, and Harald Ade. 2014. “Topographic Measurement of Buried Thin-Film Interfaces Using a Grazing Resonant Soft x-Ray Scattering Technique.” Physical Review B: Condensed Matter & Materials Physics 90 (24): 245421-1-245421–29. doi:10.1103/PhysRevB.90.245421.