Trap density in conducting organic semiconductors determined from temperature dependence of J-V characteristics.

Space charge limited currents in organic semiconductors are frequently observed to obey the power law J-V[SUPm] and are attributed to an exponential distribution of traps having two parameters, namely the characteristic distribution energy E[SUBt] and the trap concentration H[SUBt]. We determine these parameters from the J(V) characteristics at two or more temperatures reported in literature. [ABSTRACT FROM AUTHOR]