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Analog Circuit Fault Diagnosis via Sensitivity Computation.

Authors :
Yu, Wenxin
He, Yigang
Source :
Journal of Electronic Testing. Feb2015, Vol. 31 Issue 1, p119-122. 4p.
Publication Year :
2015

Abstract

In this paper, we present a new recursive method to compute higher order sensitivities of node voltages, as well as those of circuit performances (gain, input and output impedances, or reflection coefficients) with respect to all circuit parameters. Using the sensitivity coefficients we formulate multivariate polynomial equations. Fault identification is obtained by solving these equations with respect to element deviations. This task can be accomplished by using a multivariable Newton-Raphson procedure (mNR) for solving nonlinear multivariable equations. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
09238174
Volume :
31
Issue :
1
Database :
Academic Search Index
Journal :
Journal of Electronic Testing
Publication Type :
Academic Journal
Accession number :
101229234
Full Text :
https://doi.org/10.1007/s10836-015-5509-5