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Evolution of Polytypism in GaAs Nanowires during Growth Revealed by Time-Resolved in situ x-ray Diffraction.

Authors :
Schroth, Philipp
Köhl, Martin
Homung, Jean-Wolfgang
Dimakis, Emmanouil
Somaschini, Claudio
Geelhaar, Lutz
Biermanns, Andreas
Bauer, Sondes
Lazarev, Sergey
Pietsch, Ullrich
Baumbach, Tilo
Source :
Physical Review Letters. 2/6/2015, Vol. 114 Issue 5, p055504-1-055504-6. 6p.
Publication Year :
2015

Abstract

In III-V nanowires the energetic barriers for nucleation in the zinc blende or wurtzite arrangement are typically of a similar order of magnitude. As a result, both arrangements can occur in a single wire. Here, we investigate the evolution of this polytypism in self-catalyzed GaAs nanowires on Si(lll) grown by molecular beam epitaxy with time-resolved in situ x-ray diffraction. We interpret our data in the framework of a height dependent Markov model for the stacking in the nanowires. In this way, we extract the mean sizes of faultless wurtzite and zinc blende segments--a key parameter of polytypic nanowires--and their temporal evolution during growth. Thereby, we infer quantitative information on the differences of the nucleation barriers including their evolution without requiring a model of the nucleus. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00319007
Volume :
114
Issue :
5
Database :
Academic Search Index
Journal :
Physical Review Letters
Publication Type :
Academic Journal
Accession number :
101338467
Full Text :
https://doi.org/10.1103/PhysRevLett.114.055504