Cite
Study of the influence of fringe edge on MEMS capacitive accelerometers self-calibration.
MLA
Dong, Linxi, et al. “Study of the Influence of Fringe Edge on MEMS Capacitive Accelerometers Self-Calibration.” Microsystem Technologies, vol. 21, no. 6, June 2015, pp. 1179–86. EBSCOhost, https://doi.org/10.1007/s00542-014-2243-3.
APA
Dong, L., Pan, Y., Lou, J., & Bao, J. (2015). Study of the influence of fringe edge on MEMS capacitive accelerometers self-calibration. Microsystem Technologies, 21(6), 1179–1186. https://doi.org/10.1007/s00542-014-2243-3
Chicago
Dong, Linxi, Ying Pan, Jinfeng Lou, and Jinyan Bao. 2015. “Study of the Influence of Fringe Edge on MEMS Capacitive Accelerometers Self-Calibration.” Microsystem Technologies 21 (6): 1179–86. doi:10.1007/s00542-014-2243-3.