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XTOP: high-resolution X-ray diffraction and imaging.

Authors :
Favre-Nicolin, Vincent
Baruchel, José
Renevier, Hubert
Eymery, Joël
Borbély, András
Source :
Journal of Applied Crystallography. Jun2015, Vol. 48 Issue 3, p620-620. 1p.
Publication Year :
2015

Abstract

The article discusses papers taken from the 12th Conference on High-Resolution X-ray Diffraction and Imaging (XTOP) held in Grenoble, France in September 2014, including laboratory and synchrotron studies of semiconductors, software for fast data analysis and microtomography of bone structure.

Subjects

Subjects :
*X-ray diffraction
*SEMICONDUCTOR research
*TOMOGRAPHY
*CONFERENCES & conventions

Details

Language :
English
ISSN :
00218898
Volume :
48
Issue :
3
Database :
Academic Search Index
Journal :
Journal of Applied Crystallography
Publication Type :
Academic Journal
Accession number :
102989918
Full Text :
https://doi.org/10.1107/S160057671500895X
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