Cite
Comparison of Atomic Force Microscopy and ScanningIon Conductance Microscopy for Live Cell Imaging.
MLA
Seifert, Jan, et al. “Comparison of Atomic Force Microscopy and ScanningIon Conductance Microscopy for Live Cell Imaging.” Langmuir, vol. 31, no. 24, June 2015, pp. 6807–13. EBSCOhost, https://doi.org/10.1021/acs.langmuir.5b01124.
APA
Seifert, J., Rheinlaender, J., Novak, P., Korchev, Y. E., & Schäffer, T. E. (2015). Comparison of Atomic Force Microscopy and ScanningIon Conductance Microscopy for Live Cell Imaging. Langmuir, 31(24), 6807–6813. https://doi.org/10.1021/acs.langmuir.5b01124
Chicago
Seifert, Jan, Johannes Rheinlaender, Pavel Novak, Yuri E. Korchev, and Tilman E. Schäffer. 2015. “Comparison of Atomic Force Microscopy and ScanningIon Conductance Microscopy for Live Cell Imaging.” Langmuir 31 (24): 6807–13. doi:10.1021/acs.langmuir.5b01124.