Back to Search Start Over

X-ray particle image velocimetry for measuring quantitative flow information inside opaque objects.

Authors :
Lee, Sang-Joon
Kim, Guk Bae
Source :
Journal of Applied Physics. 9/1/2003, Vol. 94 Issue 5, p3620. 4p. 2 Black and White Photographs, 3 Diagrams, 1 Graph.
Publication Year :
2003

Abstract

An x-ray particle image velocimetry (PIV) technique was developed to measure quantitative information on flows inside opaque objects. To acquire x-ray images suitable for PIV velocity field measurements, refraction-based edge enhancement was employed using detectable tracer particles with the object and detector separated by an experimentally determined optimal distance. The x-ray PIV method was applied to a flow in an opaque Teflon tube. The resulting amassed velocity field data were in reasonable agreement with theoretical predictions. © 2003 American Institute of Physics. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
94
Issue :
5
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
10603903
Full Text :
https://doi.org/10.1063/1.1599981