Cite
Characterization of CMOS Metamaterial Transmission Line by Compact Fractional-Order Equivalent Circuit Model.
MLA
Yang, Chang, et al. “Characterization of CMOS Metamaterial Transmission Line by Compact Fractional-Order Equivalent Circuit Model.” IEEE Transactions on Electron Devices, vol. 62, no. 9, Sept. 2015, pp. 3012–18. EBSCOhost, https://doi.org/10.1109/TED.2015.2458931.
APA
Yang, C., Yu, H., Shang, Y., & Fei, W. (2015). Characterization of CMOS Metamaterial Transmission Line by Compact Fractional-Order Equivalent Circuit Model. IEEE Transactions on Electron Devices, 62(9), 3012–3018. https://doi.org/10.1109/TED.2015.2458931
Chicago
Yang, Chang, Hao Yu, Yang Shang, and Wei Fei. 2015. “Characterization of CMOS Metamaterial Transmission Line by Compact Fractional-Order Equivalent Circuit Model.” IEEE Transactions on Electron Devices 62 (9): 3012–18. doi:10.1109/TED.2015.2458931.