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Fictive temperature dependence of density fluctuation in SiO[sub 2] glass.
- Source :
-
Journal of Applied Physics . 10/15/2003, Vol. 94 Issue 8, p4824. 4p. 1 Diagram, 3 Charts, 4 Graphs. - Publication Year :
- 2003
-
Abstract
- Studies the fictive temperature dependence of density fluctuation in silicon oxide glass. Use of the small-angle x-ray scattering measurement; Effect of structural relaxation on the density fluctuation; Estimation of the isothermal compressibility.
- Subjects :
- *TEMPERATURE
*DENSITY
*SILICON oxide
*GLASS
*X-ray scattering
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 94
- Issue :
- 8
- Database :
- Academic Search Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 10965253
- Full Text :
- https://doi.org/10.1063/1.1608477