Direct conversion X-ray sensors: sensitivity, DQE and MTF.

Authors :: Kabir, M.Z.
Kasap, S.O.
Zhao, W.
Rowlands, J.A.
Source :: IEE Proceedings -- Circuits, Devices & Systems. Aug2003, Vol. 150 Issue 4, p258. 9p.
Publication Year :: 2003
Abstract: Presents a theoretical model for the calculation of X-ray sensitivity of a pixilated detector by using the Shockley-Ramo theorem. Introduction to direct conversion flat panel digital X-ray image detectors; Description about X-ray sensitivity; Imaging characteristics of photoconductive at panel X-ray image detectors; Measurement of presampling modulation transfer function of the prototype detector.