160-A bulk GaN Schottky diode array.

Pt Schottky rectifier arrays were fabricated on 200-μm-thick, freestanding GaN layers. Even with the reduced dislocation density in these layers (∼10[sup 5] cm[sup -2]) relative to conventional GaN on sapphire (>10[sup 8] cm[sup -2]), rectifiers fabricated on the freestanding GaN show a strong dependence of reverse breakdown on contact diameter. We show that by interconnecting the output of many (∼130) smaller (500 μm×500 μm) rectifiers, we can achieve high total forward output current (161 A at 7.12 V), low forward turn-on voltage of ∼3 V, and maintain the reverse breakdown voltage. The on/off ratio of the rectifier array was ∼8×10[sup 7] at 5 V/-100 V. © 2003 American Institute of Physics. [ABSTRACT FROM AUTHOR]