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Pump-probe Kelvin-probe force microscopy: Principle of operation and resolution limits.
- Source :
-
Journal of Applied Physics . 2015, Vol. 118 Issue 15, p154302-1-154302-8. 8p. 3 Diagrams, 4 Graphs. - Publication Year :
- 2015
-
Abstract
- Knowledge on surface potential dynamics is crucial for understanding the performance of modern-type nanoscale devices. We describe an electrical pump-probe approach in Kelvin-probe force microscopy that enables a quantitative measurement of dynamic surface potentials at nanosecond-time and nanometer-length scales. Also, we investigate the performance of pump-probe Kelvin-probe force microscopy with respect to the relevant experimental parameters. We exemplify a measurement on an organic field effect transistor that verifies the undisturbed functionality of our pump-probe approach in terms of simultaneous and quantitative mapping of topographic and electronic information at a high lateral and temporal resolution. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 118
- Issue :
- 15
- Database :
- Academic Search Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 110495517
- Full Text :
- https://doi.org/10.1063/1.4933289