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A low-power fast tag comparator by modifying charging scheme of wide fan-in dynamic OR gates.

Authors :
Nasserian, Mahshid
Kafi-Kangi, Mohammad
Maymandi-Nejad, Mohammad
Moradi, Farshad
Source :
Integration: The VLSI Journal. Jan2016, Vol. 52, p129-141. 13p.
Publication Year :
2016

Abstract

In this paper, a new charging scheme for reducing the power consumption of dynamic circuits is presented. The proposed technique is suitable for large fan-in gates where the dynamic node discharges frequently. Simulation results demonstrate that the proposed method is efficiently controlling the internal voltage swing and hence decreasing the power consumption of the wide fan-in OR gate without sacrificing other circuit parameters such as gate speed, area or noise immunity. The power-delay product of a simulated 8-input OR gate is reduced by 46%, compared to its conventional dynamic counterpart in the 90 nm CMOS technology. Another important benefit of the proposed approach is 99X reduction in power dissipation of the gate load by limiting its switching activity. Furthermore, the delay of the proposed circuit experiences only 0.94% variation over 10% fluctuation in the threshold voltages of all transistors for a 32-bit OR gate. Using the proposed technique, a 40-bit tag comparator is simulated at 1 GHz clock frequency. The power consumption of the designed circuit is as low as 1.987 µW/MHz, while the delay and unity noise gain (UNG) of the circuit are 244 ps and 499 mV, respectively. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
01679260
Volume :
52
Database :
Academic Search Index
Journal :
Integration: The VLSI Journal
Publication Type :
Academic Journal
Accession number :
111409401
Full Text :
https://doi.org/10.1016/j.vlsi.2015.09.004