Cite
Cross-sectional atom probe tomography sample preparation for improved analysis of fins on SOI.
MLA
Martin, Andrew J., et al. “Cross-Sectional Atom Probe Tomography Sample Preparation for Improved Analysis of Fins on SOI.” Ultramicroscopy, vol. 161, Feb. 2016, pp. 105–09. EBSCOhost, https://doi.org/10.1016/j.ultramic.2015.11.013.
APA
Martin, A. J., Weng, W., Zhu, Z., Loesing, R., Shaffer, J., & Katnani, A. (2016). Cross-sectional atom probe tomography sample preparation for improved analysis of fins on SOI. Ultramicroscopy, 161, 105–109. https://doi.org/10.1016/j.ultramic.2015.11.013
Chicago
Martin, Andrew J., Weihao Weng, Zhengmao Zhu, Rainer Loesing, James Shaffer, and Ahmad Katnani. 2016. “Cross-Sectional Atom Probe Tomography Sample Preparation for Improved Analysis of Fins on SOI.” Ultramicroscopy 161 (February): 105–9. doi:10.1016/j.ultramic.2015.11.013.