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Chemical imaging of interfaces by sum-frequency generation microscopy: Application to patterned self-assembled monolayers.

Authors :
Kuhnke, K.
Hoffmann, D. M. P.
Wu, X. C.
Bittner, A. M.
Kern, K.
Source :
Applied Physics Letters. 11/3/2003, Vol. 83 Issue 18, p3830. 3p. 1 Diagram, 1 Graph.
Publication Year :
2003

Abstract

We demonstrate molecule-specific imaging of a chemically patterned self-assembled monolayer by IR-visible sum-frequency microscopy. The pattern on an Au substrate consists of microcontact printed 10 μm wide alkanethiolate stripes embedded in ω-carboxyalkanethiolate adsorbed from solution. We use both electronic and vibrational contrast mechanisms for a quantitative analysis of thiolate density and the coverage of the two molecular species. The evaluation of images taken at three different IR wavelengths suggests a substantial intermixing of the two thiolates occuring in the preparation procedure. © 2003 American Institute of Physics. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
83
Issue :
18
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
11209983
Full Text :
https://doi.org/10.1063/1.1624465