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Chemical imaging of interfaces by sum-frequency generation microscopy: Application to patterned self-assembled monolayers.
- Source :
-
Applied Physics Letters . 11/3/2003, Vol. 83 Issue 18, p3830. 3p. 1 Diagram, 1 Graph. - Publication Year :
- 2003
-
Abstract
- We demonstrate molecule-specific imaging of a chemically patterned self-assembled monolayer by IR-visible sum-frequency microscopy. The pattern on an Au substrate consists of microcontact printed 10 μm wide alkanethiolate stripes embedded in ω-carboxyalkanethiolate adsorbed from solution. We use both electronic and vibrational contrast mechanisms for a quantitative analysis of thiolate density and the coverage of the two molecular species. The evaluation of images taken at three different IR wavelengths suggests a substantial intermixing of the two thiolates occuring in the preparation procedure. © 2003 American Institute of Physics. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 83
- Issue :
- 18
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 11209983
- Full Text :
- https://doi.org/10.1063/1.1624465