Cite
Monitoring chip fatigue in an IGBT module based on grey relational analysis.
MLA
Zhou, Shengqi, et al. “Monitoring Chip Fatigue in an IGBT Module Based on Grey Relational Analysis.” Microelectronics Reliability, vol. 56, Jan. 2016, pp. 49–52. EBSCOhost, https://doi.org/10.1016/j.microrel.2015.10.027.
APA
Zhou, S., Zhou, L., Yu, L., Liu, S., Luo, Q., Sun, P., & Wu, J. (2016). Monitoring chip fatigue in an IGBT module based on grey relational analysis. Microelectronics Reliability, 56, 49–52. https://doi.org/10.1016/j.microrel.2015.10.027
Chicago
Zhou, Shengqi, Luowei Zhou, Litao Yu, Sucheng Liu, Quanming Luo, Pengju Sun, and Junke Wu. 2016. “Monitoring Chip Fatigue in an IGBT Module Based on Grey Relational Analysis.” Microelectronics Reliability 56 (January): 49–52. doi:10.1016/j.microrel.2015.10.027.