Cite
A Comprehensive Benchmark and Optimization of 5-nm Lateral and Vertical GAA 6T-SRAMs.
MLA
Huynh-Bao, Trong, et al. “A Comprehensive Benchmark and Optimization of 5-Nm Lateral and Vertical GAA 6T-SRAMs.” IEEE Transactions on Electron Devices, vol. 63, no. 2, Feb. 2016, pp. 643–51. EBSCOhost, https://doi.org/10.1109/TED.2015.2504729.
APA
Huynh-Bao, T., Sakhare, S., Yakimets, D., Ryckaert, J., Thean, A. V.-Y., Mercha, A., Verkest, D., & Wambacq, P. (2016). A Comprehensive Benchmark and Optimization of 5-nm Lateral and Vertical GAA 6T-SRAMs. IEEE Transactions on Electron Devices, 63(2), 643–651. https://doi.org/10.1109/TED.2015.2504729
Chicago
Huynh-Bao, Trong, Sushil Sakhare, Dmitry Yakimets, Julien Ryckaert, Aaron Voon-Yew Thean, Abdelkarim Mercha, Diederik Verkest, and Piet Wambacq. 2016. “A Comprehensive Benchmark and Optimization of 5-Nm Lateral and Vertical GAA 6T-SRAMs.” IEEE Transactions on Electron Devices 63 (2): 643–51. doi:10.1109/TED.2015.2504729.