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A mixed-level framework to estimate SER induced by SEMT in advanced technologies.
- Source :
-
International Journal of Electronics . May2016, Vol. 103 Issue 5, p807-818. 12p. - Publication Year :
- 2016
-
Abstract
- As the complementary metal oxide semiconductor feature size shrinks further, single event multiple transients (SEMTs) become more serious. However, SEMTs have not yet been appropriately modelled through traditional soft error rate (SER) estimation methods. Therefore, this paper presents a mixed-level framework to estimate SER induced by SEMTs. The precision of the proposed framework is verified through HSPICE simulation. The results show that multiple pulses and convergence of SEMTs significantly affect SER estimation. [ABSTRACT FROM PUBLISHER]
Details
- Language :
- English
- ISSN :
- 00207217
- Volume :
- 103
- Issue :
- 5
- Database :
- Academic Search Index
- Journal :
- International Journal of Electronics
- Publication Type :
- Academic Journal
- Accession number :
- 113206128
- Full Text :
- https://doi.org/10.1080/00207217.2015.1072845