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Graphene-oxide-semiconductor planar-type electron emission device.

Authors :
Katsuhisa Murakami
Shunsuke Tanaka
Akira Miyashita
Masayoshi Nagao
Yoshihiro Nemoto
Masaki Takeguchi
Jun-ichi Fujita
Source :
Applied Physics Letters. 2/22/2016, Vol. 108 Issue 8, p083506-1-083506-4. 4p. 2 Diagrams, 2 Graphs.
Publication Year :
2016

Abstract

Graphene was used as the topmost electrode for a metal-oxide-semiconductor planar-type electron emission device. With several various layers, graphene as a gate electrode on the thin oxide layer was directly deposited by gallium vapor-assisted chemical vapor deposition. The maximum efficiency of the electron emission, defined as the ratio of anode current to cathode current, showed no dependency on electrode thickness in the range from 1.8 nm to 7.0 nm, indicating that electron scattering on the inside of the graphene electrode is practically suppressed. In addition, a high emission current density of 1–100 mA/cm2 was obtained while maintaining a relatively high electron emission efficiency of 0.1%–1.0%. The graphene-oxide-semiconductor planar-type electron emission device has great potential to achieve both high electron emission efficiency and high electron emission current density in practical applications. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
108
Issue :
8
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
113422651
Full Text :
https://doi.org/10.1063/1.4942885