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Dual-Gate JFET Modeling II: Source Pinchoff Voltage and Complete I\textrm {ds} Modeling Formalism.

Authors :
Xia, Kejun
McAndrew, Colin C.
Grote, Bernhard
Source :
IEEE Transactions on Electron Devices. Apr2016, Vol. 63 Issue 4, p1416-1422. 7p.
Publication Year :
2016

Abstract

This paper studies the phase diagram of source pinchoff of dual-gate JFETs and presents a source pinchoff modeling formalism that is smooth across the phase boundaries. Based on this, an I\textrm {ds} model is derived, which is numerically robust for any value of top- and bottom-gate voltages. The method is applied to both the exact model for I\textrm {ds} and an approximated form based on mid-point-potential linearization, and is verified by comparison with numerical simulation. Modeling of short-channel effects is included. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189383
Volume :
63
Issue :
4
Database :
Academic Search Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
114035663
Full Text :
https://doi.org/10.1109/TED.2016.2521759