Cite
Corroboration of Raman and AFM mapping to study Si nanocrystals embedded in SiO2.
MLA
Rani, Ekta, et al. “Corroboration of Raman and AFM Mapping to Study Si Nanocrystals Embedded in SiO2.” Journal of Alloys & Compounds, vol. 672, July 2016, pp. 403–12. EBSCOhost, https://doi.org/10.1016/j.jallcom.2016.02.109.
APA
Rani, E., Ingale, A. A., Chaturvedi, A., Joshi, M. P., & Kukreja, L. M. (2016). Corroboration of Raman and AFM mapping to study Si nanocrystals embedded in SiO2. Journal of Alloys & Compounds, 672, 403–412. https://doi.org/10.1016/j.jallcom.2016.02.109
Chicago
Rani, Ekta, Alka A. Ingale, A. Chaturvedi, M.P. Joshi, and L.M. Kukreja. 2016. “Corroboration of Raman and AFM Mapping to Study Si Nanocrystals Embedded in SiO2.” Journal of Alloys & Compounds 672 (July): 403–12. doi:10.1016/j.jallcom.2016.02.109.