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Application of a Pulsed Laser to Identify a Single-Event Latchup Precursor.
- Source :
-
IEEE Transactions on Nuclear Science . Dec2015 Part 1, Vol. 62 Issue 6a, p2679-2686. 8p. - Publication Year :
- 2015
-
Abstract
- Focused, pulsed laser-light is used to investigate single-event latchup in an analog-to-digital converter (AD9240) through the generation of charge collection spectra and their dependence on bias, laser pulse intensity and strike location. Large bipolar single-event transients were identified as precursors to latchup. They occurred at bias voltages just below the latchup holding voltage and in regions that became sensitive to single-event latchup at voltages above the holding voltage. Charge collection spectra obtained from spatial scans involving the pulsed laser had features similar to those obtained from heavy-ion irradiation. Both approaches indicated enhanced charge collection at supply voltages just below the holding voltage. [ABSTRACT FROM PUBLISHER]
Details
- Language :
- English
- ISSN :
- 00189499
- Volume :
- 62
- Issue :
- 6a
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Nuclear Science
- Publication Type :
- Academic Journal
- Accession number :
- 115132536
- Full Text :
- https://doi.org/10.1109/TNS.2015.2498280