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Hydrogen Limits for Total Dose and Dose Rate Response in Linear Bipolar Circuits.

Authors :
Adell, Philippe. C.
Rax, Bernard
Esqueda, Ivan S.
Barnaby, Hugh. J.
Source :
IEEE Transactions on Nuclear Science. Dec2015 Part 1, Vol. 62 Issue 6a, p2476-2481. 6p.
Publication Year :
2015

Abstract

Soaked-hydrogen irradiations show the H_2 limits for the total-dose and dose-rate response of bipolar technologies. We use an analytical model to extrapolate experimental observations and generate an H_2 limits/dose-rate safe-operating-area for various total-dose conditions. Results indicate that 0.1% is the H_2 limit that can impact device degradation. We also show that the impact is larger for higher dose levels and that extra care needs to be taken when qualifying electronics for specific missions. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
00189499
Volume :
62
Issue :
6a
Database :
Academic Search Index
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
115132540
Full Text :
https://doi.org/10.1109/TNS.2015.2500198