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Optical and dielectric properties of PbZrO3 thin films prepared by a sol-gel process for energy-storage application.
- Source :
-
Materials & Design . Jan2016, Vol. 90, p410-415. 6p. - Publication Year :
- 2016
-
Abstract
- PbZrO3 thin films with (100) and (111) orientation were prepared by a simple sol-gel method. X-ray diffraction results revealed that post-annealing temperatures played an important role on the orientation of PbZrO3 films. The frequency dependence of dielectric properties and the ferroelectric characteristics were measured. Giant energy-storage density and energy-storage efficiency calculated from hysteresis loops achieved about 25.25 J/cm3 and 62% for PbZrO3 film with thickness of 292 nm, respectively, results indicated that PbZrO3 thin films had a potential application in energy-storage device. Optical properties of PbZrO3 thin films were analyzed by a spectroscopic ellipsometer, results revealed that (111)-orientated PbZrO3 thin films exhibited higher refractive index than that of the (100)-orientated PbZrO3 thin films. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 02641275
- Volume :
- 90
- Database :
- Academic Search Index
- Journal :
- Materials & Design
- Publication Type :
- Academic Journal
- Accession number :
- 115344684
- Full Text :
- https://doi.org/10.1016/j.matdes.2015.11.012