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Hopf bifurcation in the Hodgkin–Huxley model exposed to ELF electrical field

Authors :
Jiang, Wang
Tsang, Kai Ming
Hua, Zhang
Source :
Chaos, Solitons & Fractals. May2004, Vol. 20 Issue 4, p759. 6p.
Publication Year :
2004

Abstract

This paper discussed the interference between external electric exposure and biological objects. Based on results of space-time characteristics of trans-membrane voltage, the variation of cell trans-membrane voltage exposed to extremely low frequency (ELF) electrical field was analyzed; the traditional Hodgkin–Huxley model was modified by importing new parameter denoting external electrical fields, and the bifurcation caused by new parameter war found. This paper employed the algebra criterion in high dimension equations to perform the analysis of single parameter dynamical bifurcation. The results were biological significant and suggested that the aberration of dynamics in bio-systems may be accounted for diseases caused by electric exposure. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
09600779
Volume :
20
Issue :
4
Database :
Academic Search Index
Journal :
Chaos, Solitons & Fractals
Publication Type :
Periodical
Accession number :
11572011
Full Text :
https://doi.org/10.1016/j.chaos.2003.08.011