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Time-of-flight MeV-SIMS with beam induced secondary electron trigger.
- Source :
-
Nuclear Instruments & Methods in Physics Research Section B . Aug2016, Vol. 380, p94-98. 5p. - Publication Year :
- 2016
-
Abstract
- A new Time-of-flight MeV Secondary Ion Mass Spectrometry (MeV-SIMS) setup was developed to be used with a capillary microprobe for molecular imaging with heavy primary ions at MeV energies. Due to the low output current of the ion collimating capillary a Time-of-flight (ToF) measurement method with high duty cycle is necessary. Secondary electrons from the sample surface and transmitted ions were studied as start signals. They enable measurements with a continuous primary beam and unpulsed ToF spectrometer. Tests with various primary ion beams and sample types have shown that a secondary electron signal is obtained from 30% to 40% of incident MeV particles. This provides a ToF start signal with considerably better time resolution than the one obtained from transmitted primary ions detected in a radiation hard gas ionization detector. Beam induced secondary electrons therefore allow for MeV-SIMS measurements with reasonable mass resolution at primary ion beam currents in the low fA range. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 0168583X
- Volume :
- 380
- Database :
- Academic Search Index
- Journal :
- Nuclear Instruments & Methods in Physics Research Section B
- Publication Type :
- Academic Journal
- Accession number :
- 115884630
- Full Text :
- https://doi.org/10.1016/j.nimb.2016.05.011