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High Ms Fe16N2 thin film with Ag under layer on GaAs substrate.
- Source :
-
AIP Advances . 2016, Vol. 6 Issue 5, p1-5. 5p. - Publication Year :
- 2016
-
Abstract
- (001) textured Fe16N2 thin film with Ag under layer is successfully grown on GaAs substrate using a facing target sputtering (FTS) system. After post annealing, chemically ordered Fe16N2 phase is formed and detected by X-ray diffraction (XRD). High saturation magnetization (Ms) is measured by a vibrating sample magnetometer (VSM). In comparison with Fe16N2 with Ag under layer on MgO substrate and Fe16N2 with Fe under layer on GaAs substrate, the current layer structure shows a higher Ms value, with a magnetically softer feature in contrast to the above cases. In addition, X-ray photoelectron spectroscopy (XPS) is performed to characterize the binding energy of N atoms. To verify the role of strain that the FeN layer experiences in the above three structures, Grazing Incidence X-ray Diffraction (GIXRD) is conducted to reveal a large in-plane lattice constant due to the in-plane biaxial tensile strain. [ABSTRACT FROM AUTHOR]
- Subjects :
- *THIN film research
*SILVER
*GALLIUM arsenide
Subjects
Details
- Language :
- English
- ISSN :
- 21583226
- Volume :
- 6
- Issue :
- 5
- Database :
- Academic Search Index
- Journal :
- AIP Advances
- Publication Type :
- Academic Journal
- Accession number :
- 115891088
- Full Text :
- https://doi.org/10.1063/1.4943236