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A Correction Factor to the Two-Bias Method for Determining Mobility-Lifetime Products in Pixelated Detectors.

Authors :
Koehler, Will
Streicher, Michael
O'Neal, Sean
He, Zhong
Source :
IEEE Transactions on Nuclear Science. Jun2016 Part 3, Vol. 63 Issue 3c, p1832-1838. 7p.
Publication Year :
2016

Abstract

The two-bias method typically used to calculate the mobility-lifetime product ( $\mu \tau $ ) in single-polarity charge sensing detectors, uses induced signals from cathode-side events to measure the $\mu \tau $ . This method assumes an ideal weighting potential (exactly zero through the bulk and a rapid rise to unity at the anode). When a non-ideal weighting potential (e.g., from a pixelated detector) is used, the $\mu \tau $ is systematically overestimated. In this work, we characterize this overestimation and present a simple correction factor $k$ that can be applied to pixelated electrode configurations. It was found that the correction factor is only dependent on the pixel-pitch to detector thickness ratio. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
00189499
Volume :
63
Issue :
3c
Database :
Academic Search Index
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
116342908
Full Text :
https://doi.org/10.1109/TNS.2016.2548420