loT spans edge to data center.

Information about several papers discussed in the Burn-in and Test Strategies (BiTS) Workshop held in March 2016 in Mesa, Arizona, is presented. Topics discussed include Internet of Things (IoT), development of ultrathin flexible near-field communication (NFC), and the application of metal-oxide (IGZO) thin film transistor (TFT) technology on plastic film to integrate flexible chips into game cards. The event featured notable people such as Risto Puhakka. INSET: Intel Security report reveals critical need for im.