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Defect visualization of Cu(InGa)(SeS)2 thin films using DLTS measurement.
- Source :
-
Scientific Reports . 8/5/2016, p30554. 1p. - Publication Year :
- 2016
Details
- Language :
- English
- ISSN :
- 20452322
- Database :
- Academic Search Index
- Journal :
- Scientific Reports
- Publication Type :
- Academic Journal
- Accession number :
- 117298594
- Full Text :
- https://doi.org/10.1038/srep30554