Cite
Insight Into Electron Traps and Their Energy Distribution Under Positive Bias Temperature Stress and Hot Carrier Aging.
MLA
Duan, Meng, et al. “Insight Into Electron Traps and Their Energy Distribution Under Positive Bias Temperature Stress and Hot Carrier Aging.” IEEE Transactions on Electron Devices, vol. 63, no. 9, Sept. 2016, pp. 3642–48. EBSCOhost, https://doi.org/10.1109/TED.2016.2590946.
APA
Duan, M., Zhang, J. F., Ji, Z., Zhang, W. D., Vigar, D., Asenov, A., Gerrer, L., Chandra, V., Aitken, R., & Kaczer, B. (2016). Insight Into Electron Traps and Their Energy Distribution Under Positive Bias Temperature Stress and Hot Carrier Aging. IEEE Transactions on Electron Devices, 63(9), 3642–3648. https://doi.org/10.1109/TED.2016.2590946
Chicago
Duan, Meng, Jian Fu Zhang, Zhigang Ji, Wei Dong Zhang, David Vigar, Asen Asenov, Louis Gerrer, Vikas Chandra, Rob Aitken, and Ben Kaczer. 2016. “Insight Into Electron Traps and Their Energy Distribution Under Positive Bias Temperature Stress and Hot Carrier Aging.” IEEE Transactions on Electron Devices 63 (9): 3642–48. doi:10.1109/TED.2016.2590946.