Back to Search Start Over

Power efficient SRAM design with integrated bit line charge pump.

Authors :
Wang, Xu
Zhang, Yuanzhi
Lu, Chao
Mao, Zhigang
Source :
AEU: International Journal of Electronics & Communications. Oct2016, Vol. 70 Issue 10, p1395-1402. 8p.
Publication Year :
2016

Abstract

Bit line toggling of SRAM systems in write operations leads to the largest portion of power dissipation. To reduce this amount of power loss and achieve power efficient memory, we propose a new SRAM design that integrates charge pump circuits to harvest and reuse bit line charge. In this work, a power-efficient charge recycling SRAM is designed and implemented in 180 nm CMOS technology. Post-layout simulation demonstrates an 11% of power saving and 3.8% of area overhead, if the bit width of SRAM is chosen as 8. Alternatively, 22% of power reduction is obtained if the bit width of SRAM is extended to 64. Compared with existing charge recycling SRAM schemes, this proposed SRAM is robust to process variation, demonstrates good read/write stability, and illustrates better trade-off between design complexity and power reduction. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
14348411
Volume :
70
Issue :
10
Database :
Academic Search Index
Journal :
AEU: International Journal of Electronics & Communications
Publication Type :
Academic Journal
Accession number :
117837118
Full Text :
https://doi.org/10.1016/j.aeue.2016.08.002