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Noncontact Measurement of Complex Permittivity of Electrically Small Samples at Microwave Frequencies.

Authors :
Dong, Jing
Shen, Fazhong
Dong, Yazhou
Wang, Ying
Fu, Wenli
Li, Huan
Ye, Dexin
Zhang, Bin
Huangfu, Jiangtao
Qiao, Shan
Sun, Yongzhi
Li, Changzhi
Ran, Lixin
Source :
IEEE Transactions on Microwave Theory & Techniques. Sep2016, Vol. 64 Issue 9, p2883-2893. 11p.
Publication Year :
2016

Abstract

Noncontact measurements of material parameters have important applications in various fields. In this paper, we propose a noncontact measurement of complex permittivity for electrically small samples at microwave frequencies. Based on Rayleigh approximation, we propose a noncontact measurement approach that can linearly retrieve complex permittivity from the measured impedance change. Using a subwavelength resonance, far-field radiation can be effectively suppressed, and thus the measurement is not notably influenced by unwanted environmental reflection. With the features of simple calibration and noncontact measurement, our method can be widely used in repeated on-site measurements of complex permittivity for small-sized samples at microwave frequencies. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189480
Volume :
64
Issue :
9
Database :
Academic Search Index
Journal :
IEEE Transactions on Microwave Theory & Techniques
Publication Type :
Academic Journal
Accession number :
118004723
Full Text :
https://doi.org/10.1109/TMTT.2016.2588487