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A Novel Compact Model for On-Chip Vertically-Coiled Spiral Inductors.

Authors :
Hou, Bing
Liu, Tong
Liu, Jun
Chen, Junli
Yu, Faxin
Wang, Wenbo
Source :
Journal of Electronic Testing. Oct2016, Vol. 32 Issue 5, p649-652. 4p.
Publication Year :
2016

Abstract

A novel compact model for on-chip vertically coiled spiral inductors is presented. The vertical metal coils are modeled by a ladder network consisting of ideal inductors and resistors. The skin and proximity effects are taken into consideration. The capacitive parasitics between relevant metal layers are modeled. A method to analytically extract the model parameters is proposed. The model prediction shows excellent agreement between the data from both simulation and measurement over the frequency range of 0.1-66.1 GHz, for a vertically coiled spiral inductor manufactured in TSMC 90 nm RF CMOS technology. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
09238174
Volume :
32
Issue :
5
Database :
Academic Search Index
Journal :
Journal of Electronic Testing
Publication Type :
Academic Journal
Accession number :
118439764
Full Text :
https://doi.org/10.1007/s10836-016-5613-1