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Exploiting Weak PUFs From Data Converter Nonlinearity—E.g., A Multibit CT $\Delta\Sigma$ Modulator.
- Source :
-
IEEE Transactions on Circuits & Systems. Part I: Regular Papers . Jul2016, Vol. 63 Issue 7, p994-1004. 11p. - Publication Year :
- 2016
-
Abstract
- This paper presents a novel approach of deriving physical unclonable functions (PUF) from correction circuits measuring and digitizing nonlinearities of data converters. The often digitally available correction data can then be used to generate a fingerprint of the chip. The general concept is presented and then specifically evaluated on an existing Delta-Sigma $(\Delta\Sigma)$ modulator whose outermost feedback DAC mismatches are greatly influencing the overall performance and thus need correction. The applied mixed-signal correction scheme reveals the intrinsic mismatches which are firstly used to linearize the $\Delta\Sigma$ modulator, but which can also be further analyzed. The intra-Hamming distance is initially determined to values less than 6% at nominal conditions and could be further reduced to less than 2% by applying different encodings. Regarding the distinctness of devices, the inter-Hamming distance is highly stable under all circumstances with a value very close to 50%. Though the influence of varying environmental conditions on the stability of repeated PUF readouts is negligible, inevitable deviations in the correction coefficients increase the intra-Hamming distance with respect to nominal conditions. As a result, 80 highly stable identification bits are obtained from the exemplarily used $\Delta\Sigma$ modulator. [ABSTRACT FROM PUBLISHER]
Details
- Language :
- English
- ISSN :
- 15498328
- Volume :
- 63
- Issue :
- 7
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Circuits & Systems. Part I: Regular Papers
- Publication Type :
- Periodical
- Accession number :
- 118693023
- Full Text :
- https://doi.org/10.1109/TCSI.2016.2555238